Demo Data from EDBT 2026 / reviewers in the wild / expert
Liuxi Qian
dblp:55/10511
· DBLP profile ↗
3ranked-venue papers
1as first author
0since 2021 · last 2016
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 1 first-authorApplied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 39% Integrated circuit design · 30% Performance modeling and evaluation · 30% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › analog and mixed-signal circuits
analog circuit design |
0.2 | 1 | 2016 | A yield-enhanced global optimization methodology for analog circuit based on extreme value theory · Sci. China Inf. Sci. 2016 |
Performance modeling and evaluation › statistical analysis
extreme value theory |
0.2 | 1 | 2016 | A yield-enhanced global optimization methodology for analog circuit based on extreme value theory · Sci. China Inf. Sci. 2016 |
Electronic design automation › yield analysis
yield-aware optimization |
0.2 | 1 | 2016 | A yield-enhanced global optimization methodology for analog circuit based on extreme value theory · Sci. China Inf. Sci. 2016 |
Electronic design automation › analog circuit design automation
analog circuit optimization |
0.1 | 1 | 2016 | A yield-enhanced global optimization methodology for analog circuit based on extreme value theory · Sci. China Inf. Sci. 2016 |
Methods — techniques the papers use, named apart from their topics
global optimization · 0.2extreme value theory · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2016 | A yield-enhanced global optimization methodology for analog circuit based on extreme value theory
Minghua Li, Guanming Huang, Xiulong Wu, Liuxi Qian, Xuan Zeng 0001, Dian Zhou |
Sci. China Inf. Sci. | 4 |
| 2015 | Automated Technology Migration Methodology for Mixed-Signal Circuit Based on Multistart Optimization FrameworkabstractOptimization-simulation loop-based method is popular and efficient in design migration/reuse automation. However, it is only restricted to be used in block-level due to the complexity of current mixed-signal system. This paper presents a hierarchical methodology for efficiently migrating mixed-signal circuit design from one technology node to another, while keeping the same circuit and layout topologies. It utilizes two stages of optimization processes to automatically resize and refine device dimensions in target technology. In the first stage, to avoid the costly simulation time without scarifying systematical functionality, only one block is represented in transistor level (TL), while other blocks are replaced with behavioral models. The multistart global optimization technique is applied to resize the TL block in systematic connection. This stage provides a good initial point for next system-level refinement. Moreover, for obtaining a process and parasitic closure solution, both parasitic and process variation effects are explored and used to constrain the schematic migration. A representative mixed-signal system, charge-pump phase-locked loop, is used to validate the proposed methodology. The experimental results show that the proposed methodology efficiently generates quality designs in target technology with much less simulation iterations, when comparing with recent available approaches. Liuxi Qian, Zhaori Bi, Dian Zhou, Xuan Zeng 0001 |
IEEE Trans. Very Large Scale Integr. Syst. | 1 |
| 2011 | Worst case analysis for evaluating VLSI circuit performance bounds using an optimization methodabstractThe process variations are unavoidable in today's VLSI circuits due to the continuing scaled IC technologies, therefore, the likely behaviors of VLSI circuits with process variations may fail to meet the performance specifications. This paper addresses an efficient method to evaluate the performance bounds of VLSI circuits with process variations in time domain. The described approach proceeds by solving a Nonlinear Programming (NLP) problem to find the upper and lower bounds of the interested outputs, either a node voltage or a branch current, constrained by linearlized equations, circuit equations and parameter variations. The preliminary result shows the performance bounds from the proposed method are sufficiently tight comparing with the bounds obtained from intensive Monte Carlo samplings in SPICE. Siwat Saibua, Liuxi Qian, Dian Zhou |
VLSI-SoC | 2 |