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Eric Tarver

dblp:55/2943 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1993
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Software engineering, systems software and programming languages · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software maintenance and evolution · 61% Empirical software engineering · 39%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software maintenance and evolution › software quality assurance › defect analysis
defect classification
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Empirical software engineering › software fault analysis
defect data analysis
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Software maintenance and evolution
software process improvement
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Empirical software engineering › mining software repositories
defect datasets
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993

Methods — techniques the papers use, named apart from their topics

machine-assisted data exploration · 0.0
YearPublicationVenuePosition
1993 A Case Study of Software Process Improvement During Development
abstract
We present a case study of the use of a software process improvement method which is based on the analysis of defect data. The first step of the method is the classification of software defects using attributes which relate defects to specific process activities. Such classification captures the semantics of the defects in a fashion which is useful for process correction. The second step utilizes a machine-assisted approach to data exploration which allows a project team to discover such knowledge from defect data as is useful for process correction. We show that such analysis of defect data can readily lead a project team to improve their process during development.>
Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, Jarir K. Chaar, Ram Chillarege
IEEE Trans. Software Eng.3