Demo Data from EDBT 2026 / reviewers in the wild / expert
Milagros Sashikánth
dblp:55/4550
· DBLP profile ↗
5ranked-venue papers
0as first author
0since 2021 · last 2005
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 5
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Reconfigurable computing and FPGAs · 77% Hardware reliability and fault tolerance · 23% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Reconfigurable computing and FPGAs › FPGA reliability
FPGA fault tolerance |
0.1 | 1 | 2005 | Efficient methodology for detection and correction of SEU-based interconnect errors in FPGAs using partial reconfiguration (abstract only) · FPGA 2005 |
Reconfigurable computing and FPGAs › dynamic reconfiguration
partial reconfiguration |
0.1 | 1 | 2005 | Efficient methodology for detection and correction of SEU-based interconnect errors in FPGAs using partial reconfiguration (abstract only) · FPGA 2005 |
Hardware reliability and fault tolerance › soft errors
single-event upset |
0.0 | 1 | 2005 | Efficient methodology for detection and correction of SEU-based interconnect errors in FPGAs using partial reconfiguration (abstract only) · FPGA 2005 |
Hardware reliability and fault tolerance
soft errors |
0.0 | 1 | 2005 | Efficient methodology for detection and correction of SEU-based interconnect errors in FPGAs using partial reconfiguration (abstract only) · FPGA 2005 |
Methods — techniques the papers use, named apart from their topics
shift register error propagation · 0.1partial reconfiguration · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2005 | A novel CLB architecture and circuit packing algorithm for logic-area reduction in SRAM-based FPGAsabstractThe main objective of the technique presented in this paper is to exploit the relations between a set of Boolean functions so as to generate one function from another. The paper defines a relation termed as split-equivalence between logical functions. Using this relation, a single Look-Up Table (LUT) storing the truth table of a function F may be used to generate other functions that are split-equivalent to F resulting in an overall reduction in the Logic Area used to map the circuit on the FPGA. This paper proposes a new Configurable Logic Block (CLB) architecture containing a single LUT that stores the truth table of a Boolean function F and is capable of generating three split-equivalent functions of F. Given a set of Boolean functions to be mapped onto LUTs, the technique proposed identifies sets of four functions such that any three of them are split-equivalent to the fourth. These sets are mapped on to the proposed CLB architecture. The proposed CLB architecture was compared with the standard CLBs available on Xilinx Virtex architecture and it was found that the former occupies 26% lesser area than the latter with a small increase in the SRAM configuration bits required to configure a CLB. Vivek Garg, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001 |
ASP-DAC | 3 |
| 2005 | A function generator-based reconfigurable systemabstractThis paper proposes a new reconfigurable system which has a function generator-based CLB architecture. This is different from the standard look-up table (LUT) based CLB architectures available in commercial FPGAs. The new function generation architecture is based on the fact that a small set of k-input Boolean functions can generate all the 22k, k-input Boolean functions using a simple mapping technique. The area required by the new function generation architecture is 58.6% lesser than the area required by a standard 16 x 1 LUT used in commercial FPGAs. In addition, the proposed architecture consumes 40.8% lesser power than the standard 16 x 1 LUT. The routing architecture for the proposed reconfigurable system is the same as those present in current-day FPGAs. Hence, the algorithms presently used for technology mapping, packing, placement and routing on FPGAs can be used for the proposed reconfigurable system without much modification. The new architecture requires a 10% increase in the SRAM configuration memory. This is an insignificant penalty in comparison to the reduction in the area of the FPGA and power consumption, achieved by the proposed CLB architecture. Vivek Garg, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001 |
ASP-DAC | 3 |
| 2005 | Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAsabstractThis paper proposes a cluster-based parity-checking technique that can detect 100% of all Single Event Upset (SEU) faults in the LUTs of SRAM-based FPGAs. The paper describes two different Configurable Logic Block (CLB) architectures that could be used to implement the proposed SEU detection technique. Of the two, the first architecture can perform at-speed testing of the LUTs without interrupting the normal functioning of the FPGA. The second one works by switching the CLBs from normal-mode to testing-mode and vice-versa. The LUTs are tested in the testing-mode. The switching frequency can be externally programmed and hence varied depending on the rate of SEU occurrences. Both the proposed architectures were compared with the Xilinx Virtex and Virtex Pro architecture. The proposed architectures require only 2 (when compared with Virtex) and 4 (when compared with Virtex Pro) additional SRAM configuration bits per LUT. This is extremely low when compared to the 16 additional SRAM configuration bits required by CLB architectures used to implement standard DWC techniques for detecting SEUs in LUTs. The area requirements of both the proposed architectures are also significantly less than the area requirements of DWC techniques. The proposed detection technique requires only 3 clock cycles of the Xilinx Virtex internal clock to detect the effect of an SEU in any LUT of the FPGA. E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001, Narayanan Vijaykrishnan |
ASP-DAC | 3 |
| 2005 | Efficient methodology for detection and correction of SEU-based interconnect errors in FPGAs using partial reconfiguration (abstract only)abstractThis paper proposes a new CLB architecture for FPGAs and associated testing and reconfiguration techniques that detect single routing/interconnect errors and correct them using partial reconfiguration. The results of error detection are propagated to a single output port by a chain-like shift register, which are used to reduce the segment of the routing architecture that has to be reconfigured. The error is corrected by partially reconfiguring the above minimal segment alone, thereby reducing the time for reconfiguration. The proposed testing technique detects all possible routing errors that affects the logic of the circuit, including bridging faults. It is noteworthy that the time required for error detection is independent of both the number of switch matrices and the number of logic blocks in the FPGA. Empirically, our technique detected all single interconnect errors in benchmark circuits. In addition, for the majority of errors, our correction technique required less than 10% of the switch matrices to be reconfigured to correct the errors. E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001, Narayanan Vijaykrishnan |
FPGA | 3 |
| 2004 | A novel CLB architecture to detect and correct SEU in LUTs of SRAM-based FPGAsabstractThis work proposes a new CLB architecture for FPGAs that can detect and correct single event upset (SEU) faults in the LUTs. A methodology for mapping logical functions onto the LUTs is presented that exploits the features of the proposed CLB architecture to detect and correct the SEU faults in the LUTs. Experimental results obtained by mapping standard benchmark circuits on the proposed architecture indicate that on an average, 96% of the SEU in the LUTs can be detected without employing any redundancy. Further, by using duplication with comparison (DWC) techniques it is shown that 100% of the SEU in the LUTs can be detected for any circuit that is mapped on the proposed architecture; and for the benchmark circuits, on an average, 96% of the SEU in the LUTs can be automatically (without any user intervention or reconfiguration) corrected. E. Syam Sundar Reddy, Vikram Chandrasekhar, Milagros Sashikánth, V. Kamakoti 0001, Narayanan Vijaykrishnan |
FPT | 3 |