Demo Data from EDBT 2026 / reviewers in the wild / expert
Tadashi Yasufuku
dblp:55/7550
· DBLP profile ↗
5ranked-venue papers
2as first author
0since 2021 · last 2013
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 5 · 2 first-authorApplied, interdisciplinary, general and emerging computing · 3 · 2 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 40% Electronic design automation · 40% Hardware reliability and fault tolerance · 20% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › digital circuit design › logic gate design
CMOS gate |
0.1 | 1 | 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gates · DAC 2011 |
Integrated circuit design
digital circuit design |
0.1 | 1 | 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gates · DAC 2011 |
Electronic design automation › timing analysis
statistical timing analysis |
0.1 | 1 | 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gates · DAC 2011 |
Electronic design automation
timing analysis |
0.1 | 1 | 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gates · DAC 2011 |
Hardware reliability and fault tolerance › process variation
within-die variation |
0.1 | 1 | 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gates · DAC 2011 |
Methods — techniques the papers use, named apart from their topics
monte carlo simulation · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2013 | Minimizing Energy of Integer Unit by Higher Voltage Flip-Flop: VDDmin-Aware Dual Supply Voltage TechniqueabstractTo achieve the most energy-efficient operation, this brief presents a circuit design technique for separating the power supply voltage (VDD) of flip-flops (FFs) from that of combinational circuits, called the higher voltage FF (HVFF). Although VDDscaling can reduce the energy, the minimum operating voltage (VDDmin) of FFs prevents the operation at the optimum supply voltage that minimizes the energy, because the VDDminof FFs is higher than the optimum supply voltage. In HVFF, the VDDof combinational logic gates is reduced below the VDDminof FFs while keeping the VDDof FFs at their VDDmin. This makes it possible to minimize the energy without power and delay penalties at the nominal supply voltage (1.2 V) as well as without FF topological difications. A 16-bit integer unit with HVFF is fabricated in a 65-nm CMOS process, and measurement results show that HVFF reduces the minimum energy by 13% compared with the conventional operation, which is 1/10 times smaller than the energy at the nominal supply voltage. Hiroshi Fuketa, Koji Hirairi, Tadashi Yasufuku, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai |
IEEE Trans. Very Large Scale Integr. Syst. | 3 |
| 2011 | A closed-form expression for estimating minimum operating voltage (VDDmin) of CMOS logic gatesabstractIn this paper, a closed-form expression for estimating a minimum operating voltage (VDDmin) of CMOS logic gates is proposed. VDDmin is defined as the minimum supply voltage at which circuits can operate correctly. VDDmin of combinational circuits can be written as a linear function of the square-root of logarithm of the number of logic gates and its slope is proportional to the standard deviation of the within-die variation in the threshold voltage difference between PMOS and NMOS transistors. The proposed expression is verified with Monte Carlo simulations using various gate chains. The verification reveals that VDDmin of inverter chains can be estimated within 11% error. The expression is also verified with silicon measurements in a 65nm CMOS process. Hiroshi Fuketa, Satoshi Iida, Tadashi Yasufuku, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai |
DAC | 3 |
| 2011 | 12.7-times energy efficiency increase of 16-bit integer unit by power supply voltage (VDD) scaling from 1.2v to 310mv enabled by contention-less flip-flops (CLFF) and separated VDD between flip-flops and combinational logics
Hiroshi Fuketa, Koji Hirairi, Tadashi Yasufuku, Makoto Takamiya, Masahiro Nomura, Hirofumi Shinohara, Takayasu Sakurai |
ISLPED | 3 |
| 2011 | Investigation of determinant factors of minimum operating voltage of logic gates in 65-nm CMOS
Tadashi Yasufuku, Satoshi Iida, Hiroshi Fuketa, Koji Hirairi, Masahiro Nomura, Makoto Takamiya, Takayasu Sakurai |
ISLPED | 1 |
| 2009 | Inductor design of 20-V boost converter for low power 3D solid state drive with NAND flash memoriesabstractA 3D-integrated Solid State Drive (SSD) with the boost converter can achieve both the low power and the fast write-operation at the small die area of the NAND flash memory. The performance of the boost converter, however, is critically affected by the inductor, because the output voltage of the boost converter, the rising time, and the energy consumption during the boost are determined by the inductor. Therefore, this paper proposes a design methodology of the inductor of the boost converter for the 3D SSD. By using the boost converter with the optimized inductor, the energy during write-operation of the proposed 1.8-V 3D-SSD is decreased by 68% compared with the conventional 3.3-V 3D-SSD with the charge pump. Tadashi Yasufuku, Koichi Ishida, Shinji Miyamoto, Hiroto Nakai, Makoto Takamiya, Takayasu Sakurai, Ken Takeuchi |
ISLPED | 1 |