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Donald M. Schuler

dblp:56/10971 · DBLP profile ↗
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3ranked-venue papers
2as first author
0since 2021 · last 1984
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Electronic design automation · 98% Integrated circuit design · 2%

Topics — the 8 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
logic simulation
0.011984
THEMIS logic simulator - a mix mode, multi-level, hierarchical, interactive digital circuit simulator · DAC 1984
Electronic design automation › hardware simulation › multilevel simulation
mixed-mode simulation
0.011984
THEMIS logic simulator - a mix mode, multi-level, hierarchical, interactive digital circuit simulator · DAC 1984
Electronic design automation › hardware simulation
multilevel simulation
0.011984
THEMIS logic simulator - a mix mode, multi-level, hierarchical, interactive digital circuit simulator · DAC 1984
Electronic design automation
hardware verification and test
0.021977
An efficient method of fault simulation for digital circuits modeled from boolean gates and memories · DAC 1977
Random test generation using concurrent logic simulation · DAC 1975
Electronic design automation › hardware verification and test
fault simulation
0.011977
An efficient method of fault simulation for digital circuits modeled from boolean gates and memories · DAC 1977
Electronic design automation
interactive simulation
0.011984
THEMIS logic simulator - a mix mode, multi-level, hierarchical, interactive digital circuit simulator · DAC 1984
Electronic design automation › hardware verification and test › test generation
random test generation
0.011975
Random test generation using concurrent logic simulation · DAC 1975
Integrated circuit design
digital circuit design
0.011977
An efficient method of fault simulation for digital circuits modeled from boolean gates and memories · DAC 1977

Methods — techniques the papers use, named apart from their topics

memory modeling · 0.0concurrent logic simulation · 0.0boolean gate modeling · 0.0
YearPublicationVenuePosition
1984 THEMIS logic simulator - a mix mode, multi-level, hierarchical, interactive digital circuit simulator
Mahesh H. Doshi, Roderick B. Sullivan, Donald M. Schuler
DAC3
1977 An efficient method of fault simulation for digital circuits modeled from boolean gates and memories
Donald M. Schuler, Roger K. Cleghorn
DAC1
1975 Random test generation using concurrent logic simulation
Donald M. Schuler, Ernst G. Ulrich, Thomas E. Baker, Susan P. Bryant
DAC1