EDBT 2026 Demo / reviewers in the wild / expert

Berend W. Meijer

dblp:56/1870 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 91% Integrated circuit design · 9%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
analog circuit testing		 0.011990
Testability analysis of analog systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Electronic design automation
hardware verification and test		 0.011990
Testability analysis of analog systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Electronic design automation › hardware verification and test
testability analysis		 0.011990
Testability analysis of analog systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Integrated circuit design › analog and mixed-signal circuits
analog circuit design		 0.011990
Testability analysis of analog systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990

Methods — techniques the papers use, named apart from their topics

statistical analysis · 0.0rank-test algorithm · 0.0
YearPublicationVenuePosition
1990 Testability analysis of analog systems
abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm will find sets of dependent parameters and determine whether it is possible to calculate a certain parameter with sufficient accuracy. it also determines a subset of appropriate measurements if redundant measurements are present.>
Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1988 TASTE: A Tool for Analog System Testability Evaluation
abstract
A method is presented to analyze the testability of both linear and nonlinear analog systems. It combines a rank-test algorithm with statistical methods. The algorithm finds sets of inseparable parameters and determines whether it is possible to calculate a certain parameter with efficient accuracy. It also determines a subset of appropriate measurements if redundant measurements are present.>
Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff
 ITC2