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Ayee Goundan

dblp:56/993 · DBLP profile ↗
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3ranked-venue papers
3as first author
0since 2021 · last 1980
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 3 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Electronic design automation · 100%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test › fault modeling
fault equivalence
0.031980
Identification of Equivalent Faults in Logic Networks · IEEE Trans. Computers 1980
Design of Totally Fault Locatable Combinational Networks · IEEE Trans. Computers 1980
Partitioning logic circuits to maximize fault resolution · DAC 1976
Electronic design automation
hardware verification and test
0.031980
Identification of Equivalent Faults in Logic Networks · IEEE Trans. Computers 1980
Design of Totally Fault Locatable Combinational Networks · IEEE Trans. Computers 1980
Partitioning logic circuits to maximize fault resolution · DAC 1976
Electronic design automation › hardware test
fault localization
0.011980
Design of Totally Fault Locatable Combinational Networks · IEEE Trans. Computers 1980
Electronic design automation › hardware verification and test
fault modeling
0.011980
Identification of Equivalent Faults in Logic Networks · IEEE Trans. Computers 1980
Electronic design automation
logic synthesis
0.021980
Identification of Equivalent Faults in Logic Networks · IEEE Trans. Computers 1980
Design of Totally Fault Locatable Combinational Networks · IEEE Trans. Computers 1980
Electronic design automation › logic synthesis
combinational logic synthesis
0.011980
Design of Totally Fault Locatable Combinational Networks · IEEE Trans. Computers 1980
Electronic design automation › physical design › circuit partitioning
logic partitioning
0.011976
Partitioning logic circuits to maximize fault resolution · DAC 1976

Methods — techniques the papers use, named apart from their topics

s-equivalence · 0.0inversion parity · 0.0intrinsic equivalence · 0.0fault class identification · 0.0fault class splitting · 0.0control point insertion · 0.0
YearPublicationVenuePosition
1980 Design of Totally Fault Locatable Combinational Networks
abstract
The design of combinational logic networks is considered in which equivalent or indistinguishable stuck-type faults are confined to a small region of the network. A general type of fault equivalence called S-equivalence is introduced, which defines fault equivalence with respect to an arbitrary set of modules S. A network N is called totally fault locatable with respect to module set S, denoted TFLS, if all specified faults in N are S-equivalent. Some general structural properties of TFLS networks are derived. The problem of designing TFLS networks is investigated for S = {AND, OR, NAND, NOR, NOT} denoted AON, and S = {AON, EXCLUSIVE- OR} denoted AONE. All equivalent fault classes in TFLAON and TFLAONE networks can be identified by inspection. It is shown that every function has a TFLAONE network, that is, a realization where all equivalence classes can be identified by inspection, containing at most one control point or extra input. A method for constructing a TFLAONE realization of an arbitrary function is presented using at most one control point.
Ayee Goundan, John P. Hayes
IEEE Trans. Computers1
1980 Identification of Equivalent Faults in Logic Networks
abstract
The properties of combinational logic functions and networks that influence equivalence among stuck-type faults are investigated. It is shown that the equivalence of certain types of faults depends only on the function being realized. For instance, the fault classes among primary input/output faults are of this type. It is shown that every irredundant realization of the two-variable EXCLUSIVE-OR function has a unique set of ten fault classes. A fault class F in a module M contained in a network N is called intrinsic, if F can be determined from M alone, i. e., F is independent of N. Using the concepts of intrinsic equivalence and inversion parity, conditions for the equivalence and nonequivalence of two fault classes are obtained. These results are applied to the problem of equivalence identification in two-level logic networks where they provide a substantial reduction in the amount of computation required.
Ayee Goundan, John P. Hayes
IEEE Trans. Computers1
1976 Partitioning logic circuits to maximize fault resolution
abstract
Two techniques are discussed for partitioning logic circuits to maximize the resolution of stuck-line faults. One technique exploits the inherent fault resolution of the circuit by attempting to force equivalent faults into the same module. The other involves inserting control points to separate members of equivalent fault classes, a technique called fault class splitting. Some new methods for identifying equivalent faults are also presented.
Ayee Goundan, John P. Hayes
DAC1