EDBT 2026 Demo / reviewers in the wild / expert
Ambarish M. Sule
dblp:58/2005
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2009
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 33% Integrated circuit design · 33% Energy-efficient computing · 33% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › 3d integration
3D IC physical design |
0.1 | 1 | 2006 | Exploring compromises among timing, power and temperature in three-dimensional integrated circuits · DAC 2006 |
Electronic design automation
physical design |
0.1 | 1 | 2006 | Exploring compromises among timing, power and temperature in three-dimensional integrated circuits · DAC 2006 |
Energy-efficient computing
thermal management |
0.1 | 1 | 2006 | Exploring compromises among timing, power and temperature in three-dimensional integrated circuits · DAC 2006 |
Methods — techniques the papers use, named apart from their topics
thermal analysis · 0.1physical design experiments · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2009 | Application Exploration for 3-D Integrated Circuits: TCAM, FIFO, and FFT Case Studiesabstract3-D stacking and integration can provide system advantages. This paper explores application drivers and computer-aided design (CAD) for 3-D integrated circuits (ICs). Interconnect-rich applications especially benefit, sometimes up to the equivalent of two technology nodes. This paper presents physical-design case studies of ternary content-addressable memories (TCAMs), first-in first-out (FIFO) memories, and a 8192-point fast Fourier transform (FFT) processor in order to quantify the benefit of the through-silicon vias in an available 180-nm 3-D process. The TCAM shows a 23% power reduction and the FFT shows a 22% reduction in cycle-time, coupled with an 18% reduction in energy per transform. William Rhett Davis, Eun Chu Oh, Ambarish M. Sule, Paul D. Franzon |
IEEE Trans. Very Large Scale Integr. Syst. | 3 |
| 2006 | Exploring compromises among timing, power and temperature in three-dimensional integrated circuitsabstractThree-dimensional integrated circuits (3DICs) have the potential to reduce interconnect lengths and improve digital system performance. However, heat removal is more difficult in 3DICs, and the higher temperatures increase delay and leakage power, potentially negating the performance improvement. Thermal vias can help to remove heat, but they create routing congestion, which also leads to longer interconnects. It is therefore very difficult to tell whether or not a particular system may benefit from 3D integration. In order to help understand this trade-off, physical design experiments were performed on a low-power and a high-performance design in an existing 3DIC technology. Each design was partitioned and routed with varying numbers of tiers and thermal-via densities. A thermal-analysis methodology is developed to predict the final performance. Results show that the lowest energy per operation and delay are achieved with 4 or 5 tiers. These results show a reduction in energy and delay of up to 27 % and 20 % compared to a traditional 2DIC approach. In addition, it is shown that thermal-vias offer no performance benefit for the low-power system and only marginal benefit for the high-performance system. Hao Hua, Christopher Mineo, Kory Schoenfliess, Ambarish M. Sule, Samson Melamed, Ravi Jenkal, William Rhett Davis |
DAC | 4 |