Demo Data from EDBT 2026 / reviewers in the wild / expert
Ram Chillarege
dblp:58/5249
· DBLP profile ↗
21ranked-venue papers
12as first author
0since 2021 · last 2018
0009-0001-8632-545XORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 15 · 8 first-authorSystems, architecture and hardware · 6 · 5 first-authorSecurity and privacy · 2 · 1 first-authorApplied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
6 papers |
Empirical software engineering · 71% Software maintenance and evolution · 27% Requirements engineering and software design · 2% | |
| Network and information security
1 paper |
Systems and software security · 100% |
Topics — the 14 heaviest of 17, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Systems and software security
vulnerability management |
0.3 | 1 | 2018 | Are vulnerabilities discovered and resolved like other defects? · ICSE 2018 |
Empirical software engineering
mining software repositories |
0.3 | 1 | 2018 | Are vulnerabilities discovered and resolved like other defects? · ICSE 2018 |
Software maintenance and evolution
software defects |
0.1 | 1 | 2018 | Are vulnerabilities discovered and resolved like other defects? · ICSE 2018 |
Software maintenance and evolution › software quality assurance › defect analysis
defect classification |
0.0 | 2 | 1993 | A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993 Orthogonal Defect Classification - A Concept for In-Process Measurements · IEEE Trans. Software Eng. 1992 |
Empirical software engineering › software fault analysis
defect data analysis |
0.0 | 1 | 1993 | A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993 |
Software maintenance and evolution
software inspection |
0.0 | 1 | 1993 | In-Process Evaluation for Software Inspection and Test · IEEE Trans. Software Eng. 1993 |
Requirements engineering and software design › software process
software process assessment |
0.0 | 1 | 1993 | In-Process Evaluation for Software Inspection and Test · IEEE Trans. Software Eng. 1993 |
Software maintenance and evolution
software process improvement |
0.0 | 1 | 1993 | A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993 |
Hardware reliability and fault tolerance
error latency |
0.0 | 2 | 1987 | Measurement-Based Analysis of Error Latency · IEEE Trans. Computers 1987 The Effect of System Workload on Error Latency: An Experimental Study · SIGMETRICS 1985 |
Empirical software engineering
software fault analysis |
0.0 | 1 | 1991 | Defect Type and Its Impact on the Growth Curve · ICSE 1991 |
Hardware reliability and fault tolerance
reliability analysis |
0.0 | 1 | 1989 | Experimental Methods in Reliability Measurement · SIGMETRICS 1989 |
Performance modeling and evaluation
workload characterization |
0.0 | 3 | 1989 | An Experimental Study of Memory Fault Latency · IEEE Trans. Computers 1989 Measurement-Based Analysis of Error Latency · IEEE Trans. Computers 1987 The Effect of System Workload on Error Latency: An Experimental Study · SIGMETRICS 1985 |
Empirical software engineering › mining software repositories
defect datasets |
0.0 | 1 | 1993 | A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993 |
Hardware reliability and fault tolerance
soft errors |
0.0 | 1 | 1989 | Experimental Methods in Reliability Measurement · SIGMETRICS 1989 |
Methods — techniques the papers use, named apart from their topics
empirical study · 0.7industrial trend analysis · 0.1machine-assisted data exploration · 0.0defect trigger distribution analysis · 0.0defect type distribution · 0.0defect trigger distribution · 0.0fault injection simulation · 0.0fault injection experiments · 0.0analysis of variance · 0.0hardware instrumentation · 0.0statistical distribution fitting · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2018 | Are vulnerabilities discovered and resolved like other defects?abstractContext: Software defect data has long been used to drive software development process improvement. If security defects (i.e.,vulnerabilities) are discovered and resolved by different software development practices than non-security defects, the knowledge of that distinction could be applied to drive process improvement. Patrick Morrison, Rahul Pandita, Xusheng Xiao, Ram Chillarege, Laurie A. Williams |
ICSE | 4 |
| 2018 | Are vulnerabilities discovered and resolved like other defects?
Patrick Morrison, Rahul Pandita, Xusheng Xiao, Ram Chillarege, Laurie A. Williams |
Empir. Softw. Eng. | 4 |
| 2006 | "Tail-Splitting" to Predict Failing Software Modules - with a Case Study on an Operating Systems Productabstract"Tail-splitting" is a new technique to identify defect prone modules by enhancing the focus of the Pareto distribution by a development process factor. The simple yet powerful influence of a varying tail membership as a function of development process phases is captured by the tail-split-string which tags each module. The case studies on an operating systems product demonstrate that the tail-split-string identifies a small set of modules with a high probability of field failure. The tail-boundary in the algorithm provides for a natural tuning parameter to control the size of the identified set to suit the resources available for rework. Release managers have found that the method is particularly useful to sift modules, with low false positive, for late stage rework Ram Chillarege, P. Santhanam |
ISSRE | 1 |
| 2004 | Reflections on Industry Trends and Experimental Research in DependabilityabstractExperimental research in dependability has evolved over the past 30 years accompanied by dramatic changes in the computing industry. To understand the magnitude and nature of this evolution, this paper analyzes industrial trends, namely: 1) shifting error sources, 2) explosive complexity, and 3) global volume. Under each-of these trends, the paper explores research technologies that are applicable either to the finished product or artifact, and the processes that are used to produce products. The study gives a framework to not only reflect on the research of the past, but also project the needs of the future. Daniel P. Siewiorek, Ram Chillarege, Zbigniew T. Kalbarczyk |
IEEE Trans. Dependable Secur. Comput. | 2 |
| 2003 | Early Warning of Failures through Alarm Analysis - A Case Study in Telecom Voice Mail SystemsabstractThis paper presents three principles for alarm analysis to develop early warnings of failure. The concepts are illustrated with real data and experience drawn from Comverse voice mail systems installed by telecom service providers worldwide. The case study demonstrates practicality of the approach and insight to further advance this body of research. Dorron Levy, Ram Chillarege |
ISSRE | 2 |
| 2002 | Test and Development Process Retrospective - A Case Study using ODC TriggersabstractWe present a case study of a product development retrospective analysis conducted to gain an understanding of the test and development process effectiveness. Orthogonal Defect Classification (ODC) is used as an analysis method to gain insight beyond what classical qualitative analysis would yield for the probable cause of delays during test. 1. ODC Trigger analysis provides the insight to understand the degree of blockage in test, probable cause, and consequences to the test and development process. 2. Trigger distribution changes with respect to time shows the stabilization of the product, and variation among components shows the systemic nature of issues. 3. The study makes nine specific inferences and recommendations based on these analyses to guide the engineering of future releases. Ram Chillarege, Kothanda Ram Prasad |
DSN | 1 |
| 1996 | What Is Software Failure?
Ram Chillarege |
IEEE Trans. Reliab. | 1 |
| 1995 | Discovering relationships between service and customer satisfactionabstractOrganizations spend significant resources tracking customer satisfaction and managing service delivery. Although a great deal of effort is expended in understanding what goes on within each of these areas, little or no effort has been applied to identifying and quantifying the relationships between the two. The objective of this research is to discover and establish potential relationships between service data and customer satisfaction. This understanding will enable more effective management, which will lead to improved quality, reduced cost and increased customer satisfaction. This study uses three years of data from an IBM operating system to measure the correlation between 15 service variables and nine customer satisfaction attributes. The results show that: (1) There is a relationship between the service data and customer satisfaction. This is the first time the existence of such a relationship has been proven and quantified. (2) The relative order of influence on customer satisfaction, of the four key service measures that are usually tracked, is defective fixes, followed by the number of problems, which in turn are followed by the number of defects and days-to-solution. The latter two were found to have little or no influence on customer satisfaction. (3) There is a return on investment of at least ten to one, for each dollar spent on quality improvement efforts in development. Michael Buckley, Ram Chillarege |
ICSM | 2 |
| 1994 | Identifying risk using ODC based growth modelsabstractThe paper uses the relative growth of defects, classified using orthogonal defect classification to get a finer insight into dynamics of the software development process during later parts of testing. This is particularly useful to help identify management actions to better use people resources (both skill and staffing levels) to respond to difficulties experienced with the product in test. Specifically, the technique helps to: identify the reasons for instability in the product demonstrated by growth modelling. Evaluate the relative stability of specific aspects of the product, such as design, code, etc. Guide the choice of resource levels and skills necessary to respond to difficulties faced in the development process.> Ram Chillarege, Shriram Biyani |
ISSRE | 1 |
| 1994 | Experiences in transferring a software process improvement methodology to production laboratories
Michael J. Halliday, Inderpal S. Bhandari, Jarir K. Chaar, Ram Chillarege |
J. Syst. Softw. | 4 |
| 1993 | Panel: Field Failures And Reliability In Operation
Ram Chillarege, Ravishankar K. Iyer, Jean-Claude Laprie, John D. Musa |
ISSRE | 1 |
| 1993 | Software recreate problems estimated to range 10-20 percent: A case study on two operating system productsabstractSoftware recreates are necessitated due to inadequate diagnostic capability following a failure. They impact the service process and the perception of availability, but have never been adequately quantified. This paper develops a technique to make the key measurements of: percent recreate, arrival rate and open time, from problem service data without requiring any additional instrumentation. The study is conducted over an 18 month period on two operating system products, that are among the best in the industry for diagnosis and service. The results provide the first insight into the problem and some accurate baselines. Ram Chillarege, Bonnie K. Ray, Al Garrigan, Dave Ruth |
ISSRE | 1 |
| 1993 | On the Evaluation of Software Inspections and TestsabstractThe goal of software inspections and tests is to reduce the expected cost of software failure over the life of a product. This paper extends the use of defect triggers, the events which cause defects to be discovered, to help evaluate the effectiveness of inspection and test activities. In the case of inspections, the defect trigger is defined as a set of values which associate the skills of the inspector with the discovered defect. Similarly, for tests, the defect trigger values embody the various strategies being used in creating test scenarios. The usefulness of triggers in evaluating the effectiveness of software inspections and tests is demonstrated by evaluating the inspection and test activities of some software products. These evaluations are used to point to both deficiencies in inspection and test strategies, and progress made in improving such strategies.> Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege |
ITC | 4 |
| 1993 | A Case Study of Software Process Improvement During DevelopmentabstractWe present a case study of the use of a software process improvement method which is based on the analysis of defect data. The first step of the method is the classification of software defects using attributes which relate defects to specific process activities. Such classification captures the semantics of the defects in a fashion which is useful for process correction. The second step utilizes a machine-assisted approach to data exploration which allows a project team to discover such knowledge from defect data as is useful for process correction. We show that such analysis of defect data can readily lead a project team to improve their process during development.> Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, Jarir K. Chaar, Ram Chillarege |
IEEE Trans. Software Eng. | 6 |
| 1993 | In-Process Evaluation for Software Inspection and TestabstractThe goal of software inspection and test is to reduce the expected cost of software failure over the life of a product. The authors extend the use of defect triggers, the events that cause defects to be discovered, to help evaluate the effectiveness of inspections and test scenarios. In the case of inspections, the defect trigger is defined as a set of values that associate the skills of the inspector with the discovered defect. Similarly, for test scenarios, the defect trigger values embody the deferring strategies being used in creating these scenarios. The usefulness of triggers in evaluating the effectiveness of software inspections and tests is demonstrated by evaluating the inspection and test activities of some software products. These evaluations are used to point to deficiencies in inspection and test strategies, and to progress made in improving such strategies. The trigger distribution of the entire inspection or test series may then be used to highlight areas for further investigation, with the aim of improving the design, implementation, and test processes.> Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege |
IEEE Trans. Software Eng. | 4 |
| 1992 | Orthogonal Defect Classification - A Concept for In-Process MeasurementsabstractOrthogonal defect classification (ODC), a concept that enables in-process feedback to software developers by extracting signatures on the development process from defects, is described. The ideas are evolved from an earlier finding that demonstrates the use of semantic information from defects to extract cause-effect relationships in the development process. This finding is leveraged to develop a systematic framework for building measurement and analysis methods. The authors define ODC and discuss the necessary and sufficient conditions required to provide feedback to a developer; illustrate the use of the defect type distribution to measure the progress of a product through a process; illustrate the use of the defect trigger distribution to evaluate the effectiveness and eventually the completeness of verification processes such as inspection or testing; provides sample results from pilot projects using ODC; and open the doors to a wide variety of analysis techniques for providing effective and fast feedback based on the concepts of ODC.> Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong |
IEEE Trans. Software Eng. | 1 |
| 1991 | Defect Type and Its Impact on the Growth Curve
Ram Chillarege, Wei-lun Kao, Richard G. Condit |
ICSE | 1 |
| 1989 | Experimental Methods in Reliability Measurement
Ram Chillarege |
SIGMETRICS | 1 |
| 1989 | An Experimental Study of Memory Fault LatencyabstractThe difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at-one (s-a-1) permanent fault models. The results show that the mean fault latency of an s-a-0 fault is nearly five times that of the s-a-1 fault. An analysis of variance is performed to quantify the relative influence of different workload measures on the evaluated latency.> Ram Chillarege, Ravishankar K. Iyer |
IEEE Trans. Computers | 1 |
| 1987 | Measurement-Based Analysis of Error LatencyabstractThis paper demonstrates a practical methodology for the study of error latency under a real workload. The method is illustrated with sampled data on the physical memory activity, gathered by hardware instrumentation on a VAX 11/780 during the normal workload cycle of the installation. These data are used to simulate fault occurrence and to reconstruct the error discovery process in the system. The technique provides a means to study the system under different workloads and for multiple days. An approach to determine the percentage of undiscovered errors is also developed and a verification of the entire methodology is performed. This study finds that the mean error latency, in the memory containing the operating system, varies by a factor of 10 to 1 (in hours) between the low and high workloads. It is found that of all errors occurring within a day, 70 percent are detected in the same day, 82 percent within the following day, and 91 percent within the third day. The increase in failure rate due to latency is not so much a function of remaining errors but is dependent on whether or not there is a latent error. Ram Chillarege, Ravishankar K. Iyer |
IEEE Trans. Computers | 1 |
| 1985 | The Effect of System Workload on Error Latency: An Experimental StudyabstractIn this paper, a methodology for determining and characterizing error latency is developed. The method is based on real workload data, gathered by an experiment instrumented on a VAX 11/780 during the normal workload cycle of the installation. This is the first attempt at jointly studying error latency and workload variations in a full production system. Distributions of error latency were generated by simulating the occurrence of faults under varying workload conditions. A family of error latency distributions so generated illustrate that error latency is not so much a function of when in time a fault occurred but rather a function of the workload that followed the failure. The study finds that the mean error latency varies by a 1 to 8 (hours) ratio between high and low workloads. The method is general and can be applied to any system. Ram Chillarege, Ravishankar K. Iyer |
SIGMETRICS | 1 |