EDBT 2026 Demo / reviewers in the wild / expert
Umesh Bakhru
dblp:59/4916
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 1995
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Interconnection networks and networks-on-chip · 87% Hardware reliability and fault tolerance · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Interconnection networks and networks-on-chip › switching network
multistage interconnection network |
0.0 | 1 | 1995 | New Bounds on the Reliability of Augmented Shuffle-Exchange Networks · IEEE Trans. Computers 1995 |
Interconnection networks and networks-on-chip › switching network › multistage interconnection network
shuffle-exchange network |
0.0 | 1 | 1995 | New Bounds on the Reliability of Augmented Shuffle-Exchange Networks · IEEE Trans. Computers 1995 |
Hardware reliability and fault tolerance
redundancy |
0.0 | 1 | 1995 | New Bounds on the Reliability of Augmented Shuffle-Exchange Networks · IEEE Trans. Computers 1995 |
Methods — techniques the papers use, named apart from their topics
analytical reliability estimation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1995 | New Bounds on the Reliability of Augmented Shuffle-Exchange NetworksabstractThe reliability resulting from two forms of redundancy, spatial and temporal, in multistage interconnection networks is examined. The extra-stage shuffle-exchange network (SEN+) which is an example of the former is investigated here. The SEN+ is decomposed into two subnetworks connected by two extreme stages. Given k random faults in one subnetwork, our problem reduces to estimating the maximum and minimum number of switches in the other subnetwork that must be operational for full access, i.e., connection between every input (processor) and output (memory) pair. This investigation results in obtaining analytical estimates for the upper and lower bounds on its reliability which are a substantial improvement over existing ones. We next examine the effect of wrap-around connections from each output node to its corresponding input node. This may provide a path between a source-destination pair under faults by diverting a given packet through one or more intermediate destinations. The reliability offered by this scheme that provides temporal redundancy is also estimated and compared with the scheme employing hardware redundancy.> Bernard L. Menezes, Umesh Bakhru |
IEEE Trans. Computers | 2 |
| 1991 | New Bounds on the Reliability of Two Augmented Shuffle-Exchange Networks
Bernard L. Menezes, Umesh Bakhru, Randolph Sergent |
ICPP (1) | 2 |