Sherin Kuriakose

dblp:60/1522 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2006
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware test
0.112006
InTeRail: A Test Architecture for Core-Based SOCs · IEEE Trans. Computers 2006
Electronic design automation › hardware verification and test
system-on-chip testing
0.112006
InTeRail: A Test Architecture for Core-Based SOCs · IEEE Trans. Computers 2006
Electronic design automation › hardware verification and test › design for testability
test access mechanism
0.112006
InTeRail: A Test Architecture for Core-Based SOCs · IEEE Trans. Computers 2006
Electronic design automation › hardware verification and test › system-on-chip testing
embedded core testing
0.012006
InTeRail: A Test Architecture for Core-Based SOCs · IEEE Trans. Computers 2006
YearPublicationVenuePosition
2006 InTeRail: A Test Architecture for Core-Based SOCs
abstract
A flexible test architecture for embedded cores and all interconnects in a system-on chip (SOC) is presented. It targets core testing parallelism and reduced test application time by using, as much as possible, existing core interconnects to form TAM paths. It also provides for dynamic wrapper reconfiguration. Algorithms that minimize the use of extra interconnects for the TAM path formation are presented and evaluated.
Dimitrios Kagaris, Spyros Tragoudas, Sherin Kuriakose
IEEE Trans. Computers3