Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page
Demo Data from EDBT 2026 / reviewers in the wild / expert

C. J. Hage

dblp:60/4019 · DBLP profile ↗
← Back
1ranked-venue papers
1as first author
0since 2021 · last 1982
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 50% Electronic design automation · 50%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
analog and mixed-signal circuits		 0.011982
Efficient Op Amp Circuit Analysis with Manufacturer Specified Macromodel Parameters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982
Electronic design automation
circuit analysis		 0.011982
Efficient Op Amp Circuit Analysis with Manufacturer Specified Macromodel Parameters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982
Integrated circuit design › analog and mixed-signal circuits › amplifier design
operational amplifier circuits		 0.011982
Efficient Op Amp Circuit Analysis with Manufacturer Specified Macromodel Parameters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1982

Methods — techniques the papers use, named apart from their topics

worst-case analysis · 0.0macromodel parameters · 0.0
YearPublicationVenuePosition
1982 Efficient Op Amp Circuit Analysis with Manufacturer Specified Macromodel Parameters
abstract
Following an efficient circuit analysis with ideal operational amplifier (op amp) models, approximate results can be rendered realistic in terms of related sensitivity/tolerance computations. Sensitivities of circuit responses to manufacturer specified op amp tolerances complete the analysis by providing nominal and worst-case in-specification output variations.
C. J. Hage, Ronald A. Rohrer
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1