This paper examines the problem of detecting single stuck-type faults in multivalued combinational circuits. The algebra employed is the generalized ternary algebra developed by Vranesic, Lee, and Smith. Many of the concepts already developed for fault detection in binary circuits generalized easily to the multivalued case. The special properties of multivalued circuits for this algebra simplifies fault detection. Specifically, this paper introduces the concept of a partially enabled gate, K-paths in combinational circuits and a new notation for multivalued fault detection. In addition, a modified form of the D-algorithm is developed for fault detection in multivalued circuits as well as a δ algorithm for the simplification of multivalued test sets.