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Y. Zisapel

dblp:61/2559 · DBLP profile ↗
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2ranked-venue papers
2as first author
0since 2021 · last 1979
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.021979
Detection of Hazards in Combinational Switching Circuits · IEEE Trans. Computers 1979
A Simplified General Method for Static Hazard Detection · IEEE Trans. Computers 1976
Electronic design automation › hardware verification and test
hazard detection		 0.021979
Detection of Hazards in Combinational Switching Circuits · IEEE Trans. Computers 1979
A Simplified General Method for Static Hazard Detection · IEEE Trans. Computers 1976

Methods — techniques the papers use, named apart from their topics

spike superposition analysis · 0.0duo-binary representation · 0.0
YearPublicationVenuePosition
1979 Detection of Hazards in Combinational Switching Circuits
abstract
This correspondence investigates a systematic binary technique for detecting static and dynamic hazards in combinational networks. The technique is based on deriving the conditions for the occurrence of spikes and considering a hazard as a superposition of spikes.
Y. Zisapel, M. Krieger, J. Kella
 IEEE Trans. Computers1
1976 A Simplified General Method for Static Hazard Detection
abstract
A simplified binary technique is presented for dedecting hazards in combinational and sequential systems. First, a duo-binary representation is developed to derive the necessary and sufficient conditions for describing transient and steady-state behavior of switching systems. The results obtained by the duo-binary representation serve to prove that static hazards in switching circuits can be detected by examining only the extreme conditions of the transient signals. Thus, a 1-hazard will appear if the value zero is assigned simultaneously to the changing signals and their complements, and a 0-hazard will appear if the value one is assigned to them.
Y. Zisapel
 IEEE Trans. Computers1