Demo Data from EDBT 2026 / reviewers in the wild / expert
James W. McKee
dblp:62/2159
· DBLP profile ↗
2ranked-venue papers
2as first author
0since 2021 · last 1977
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1 · 1 first-authorSystems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Artificial intelligence
1 paper |
3D vision · 100% | |
| Computer graphics and multimedia
1 paper |
Geometric modeling and processing · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Computer vision › 3D vision
3d object recognition |
0.0 | 1 | 1977 | Computer Recognition of Partial Views of Curved Objects · IEEE Trans. Computers 1977 |
Geometric modeling and processing › shape modeling › 3d object modeling
curved object modeling |
0.0 | 1 | 1977 | Computer Recognition of Partial Views of Curved Objects · IEEE Trans. Computers 1977 |
Methods — techniques the papers use, named apart from their topics
chain encoding · 0.0boundary image analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1977 | Computer Recognition of Partial Views of Curved ObjectsabstractThe use of a variation of chain encoding of binary boundary images is described in the context of a scene analysis system. The system can learn single views of the three-dimensional curved objects and can later recognize various partial views of the same projections of the objects. The system is completely automatic except for specifying whether the object is to be learned or recognized. James W. McKee, Jake K. Aggarwal |
IEEE Trans. Computers | 1 |
| 1975 | Finding the edges of the surfaces of three-dimensional curved objects by computer
James W. McKee, Jake K. Aggarwal |
Pattern Recognit. | 1 |