Cheng-Yen Lee

dblp:64/2485 · DBLP profile ↗
← Back
7ranked-venue papers
3as first author
6since 2021 · last 2025
0000-0002-1640-1998ORCID · corroborated

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 6 · 3 first-author · 6 since 2021Computer networks · 1Software engineering, systems software and programming languages · 1 · 1 since 2021
YearPublicationVenuePosition
2025 A Novel Mixed-Signal Flash-based Finite Impulse Response (FFIR) Filter for IoT Applications
abstract
In this paper, we present a novel mixed-signal flash-based Finite Impulse Response (FFIR) filter architecture for IoT applications. The FFIR filter is scalable in that it can implement any filter with up to a provisioned maximum number of taps. Our FFIR filter utilizes flash transistors, a type of non-volatile memory (NVM) device, to perform analog computations in the current domain, achieving low power, energy, and area requirements. This design is well-suited for the Internet of Things (IoT) applications and other scenarios where resources are highly constrained. Our FFIR filter consists of several Flash-based Coefficient Multipliers (FCMs). The FIR coefficients of each FCM are stored in its constituent flash transistors, with the threshold voltage (Vt) of the flash transistors serving as a proxy for the filter coefficients. Furthermore, the impact of process or voltage variations is mitigated by precisely tuning the Vt of the flash transistors. The tuning of the Vt of the flash transistors can be performed either in the factory by the manufacturer (to negate process variations), or by the user in the field (to negate voltage variations or aging effects). We evaluate the tolerance of FFIR filters to manufacturing variations through Monte Carlo analysis, demonstrating robustness to process and VDD variations. Our FFIR design achieves a significant improvement over previous approaches. Compared to Digital FIR (DFIR) filters operating at the fastest frequency, we reduce the average of power, energy, and area by 4.05×, 1.95×, and 6.06×, while achieving an average peak signal-to-noise ratio (PSNR) of 38.04 dB and an average effective number of bits (ENOB) of 8.87 bits. In addition, we compare our FFIR filter with state-of-the-art Analog FIR (AFIR) filters as well. Our designs demonstrate significantly improved performance of at least 1.3×, 5.3×, and 18.5× in terms of energy per tap, area, and latency, respectively, when compared with the best among 4 recently published AFIR works.
Cheng-Yen Lee, Sunil P. Khatri, Ali Ghrayeb
ASP-DAC1
2024 A Mixed-Signal Quantized Neural Network Accelerator Using Flash Transistors
abstract
This paper presents a mixed-signal architecture for implementing Quantized Neural Networks (QNNs) using flash transistors, to achieve extremely high throughput with extremely low power, energy and memory requirements. Its low resource utilization makes our design especially suited for use in edge devices. The network weights are stored in-memory using flash transistors, and neurons perform operations in the analog current domain. Our design can be programmed with any QNN whose hyperparameters (the number of layers, filters, or filter size, etc) do not exceed the maximum provisioned. Once the flash devices are programmed with a trained model and our IC is given an input, our architecture performs inference with zero access to off-chip memory. We demonstrate the robustness of our design under current-mode non-linearities arising from process, voltage, and temperature (PVT) variations. We test validation accuracy on the ImageNet dataset, and show that our IC suffers only 0.71% and 0.92% reduction in classification accuracy for Top-1 and Top-5 outputs, respectively. Our implementation achieves between$2.1\times $and$125\times $better energy efficiency than previous NVM-based QNN accelerators. Our approach provides layer partitioning and neuron sharing options, which allow us to trade off latency, power, and area amongst each other.
Kyler R. Scott, Cheng-Yen Lee, Sunil P. Khatri, Sarma B. K. Vrudhula
IEEE Trans. Circuits Syst. I Regul. Pap.2
2023 A Digital Low Dropout (LDO) Voltage Regulator Using Pseudoflash Transistors
abstract
In this article, we present a pseudoflash-based digital low dropout (Digital LDO) voltage regulator. The novelty of our pseudoflash-based Digital LDO (PFD-LDO) voltage regulator lies in the fact that we use pseudoflash (or alternately, flash) transistor subarrays for voltage regulation. By changing the threshold voltage (and thereby, the ON resistance) of these transistors, we can use the same design to meet different regulator specifications. The threshold voltage can be programed either at the factory by the manufacturer or in the field by the user. This gives the manufacturer the ability to offer a family of LDO regulators with a single design, a significant economic advantage. In addition, aging effects and temperature variations are effectively erased since the threshold voltage of the pseudoflash (or flash) transistors can be tuned to a fine degree in the field. Similarly, process variations can be canceled after manufacturing in the factory. These advantages are absent in traditional LDO regulators. Our design uses two subarrays. A coarse subarray is used to reduce the recovery time and output voltage overshoot/undershoot, while a fine subarray regulates the output voltage, minimizing the output voltage ripple. Unlike state-of-the-art LDO regulators, our design can realize multiple specifications with the same circuit. For example, we demonstrate that the$V_{\mathrm{ out}}$of the proposed PFD-LDO regulator can range from 0.7 to$1.7 {V}$when the supply voltage$V_{\mathrm{ IN}}$ranges from 0.8 to$1.8 {V}$, using the same circuit design. Over this voltage range, the proposed PFD-LDO regulator achieves$V_{\mathrm{ shoot}}< 573 \text {mV}$,$t_{\mathrm{ rec}}< 0.50 \mu \text {s}$, and$V_{\mathrm{ ripple}}< 7.4 \text {mV}$when the$I_{\max }$ranges from 15 to 250 mA.
Cheng-Yen Lee, Sunil P. Khatri
IEEE Trans. Very Large Scale Integr. Syst.1
2022 A Flash-based Current-mode IC to Realize Quantized Neural Networks
abstract
This paper presents a mixed-signal architecture for implementing Quantized Neural Networks (QNNs) using flash transistors to achieve extremely high throughput with extremely low power, energy and memory requirements. Its low resource consumption makes our design especially suited for use in edge devices. The network weights are stored in-memory using flash transistors, and nodes perform operations in the analog current domain. Our design can be programmed with any QNN whose hyperparameters (the number of layers, filters, or filter size, etc) do not exceed the maximum provisioned. Once the flash devices are programmed with a trained model and the IC is given an input, our architecture performs inference with zero access to off-chip memory. We demonstrate the robustness of our design under current-mode non-linearities arising from process and voltage variations. We test validation accuracy on the ImageNet dataset, and show that our IC suffers only 0.6% and 1.0% reduction in classification accuracy for Top-1 and Top-5 outputs, respectively. Our implementation results in a$\sim \boldsymbol {50}\times$reduction in latency and energy when compared to a recently published mixed-signal ASIC implementation, with similar power characteristics. Our approach provides layer partitioning and node sharing possibilities, which allow us to trade off latency, power, and area amongst each other.
Kyler R. Scott, Cheng-Yen Lee, Sunil P. Khatri, Sarma B. K. Vrudhula
DATE2
2021 NIST-Lite: Randomness Testing of RNGs on an Energy-Constrained Platform
abstract
Random Number Generators (RNGs) are an essential part of many embedded applications and are used for security, encryption, and built-in test applications. The output of RNGs can be tested for randomness using the well-known NIST statistical test suite. Embedded applications using True Random Number Generators (TRNGs) need to test the randomness of their TRNGs periodically, because their randomness properties can drift over time. Using the full NIST test suite is unpracticed for this purpose, because the full NIST test suite is computationally intensive, and embedded systems (especially real-time systems) often have stringent constraints on the energy and runtime of the programs that are executed on them. In this paper, we propose novel algorithms to select the most effective subset of the NIST test suite, which works within specified runtime and energy budgets. To achieve this, we rank the NIST tests based on multiple metrics, including p-value/Time, p-value/Energy, p-value/Time2and p-value/Energy2. Based on the total runtime or energy constraint specified by the user, our algorithms proceed to choose a subset of the NIST tests using this rank order. We call this subset of NIST tests as NIST-Lite. Our algorithms also take into account the runtime and energy required to generate the random sequences required (on the same platform) by the NIST-Lite tests. We evaluate the effectiveness of our method against the full NIST test suite (referred to as NIST-Full) and also against a greedily chosen subset of the NIST test suite (referred to as NIST-Greedy). We explore different variants of NIST-Lite. On average, using the same input sequences, the p-value obtained for the 4 best variants of NIST-Lite is 2× and 7× better than the p-value of NIST-Full and NIST-Greedy respectively. NIST-Lite also achieves 158× (204×) runtime (energy) reduction compared to the NIST-Full. Further, we study the performance of NIST-Lite and NIST-Full for deterministic (non-random) input sequences. For such sequences, the pass rate of the NIST-Lite tests is within 16% of the pass rate of NIST-Full on the same sequences, indicating that our NIST-Lite tests have a similar diagnostic ability as NIST-Full.
Cheng-Yen Lee, Kunal Bharathi, Joellen Lansford, Sunil P. Khatri
ICCD1
2021 A Series Stacked FinFET Structure for Digital Low Dropout Regulators with Minimum Energy Point Technique for 37.5% Energy Reduction in Cortex M0 Processor
abstract
The series stacked (SS) FinFET structure is used in digital low dropout (DLDO) regulators to withstand high input voltages and implement dynamic voltage scaling (DVS) technique with minimum energy point (MEP) technique. Through an additional delay consideration in MEP, both energy reduction and performance of the Cortex M0 processor can achieve 34.5pJ/cycle at 0.5V. Maximum energy reduction is about 37.5% and the supplying voltage varies from 0.4V to 0.775V with a search time of 2.5μs for each voltage step. The proposed SS-DLDO has fast settling time and low output voltage ripple of 1.5μs and 5mV, respectively.
Nan-Hsiung Tseng, Bo-Kuan Wu, Tzu-Ping Huang, Cheng-Yen Lee, Ke-Horng Chen, Ying-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai
ISCAS4
2008 DaVinci: dynamically adaptive virtual networks for a customized internet
abstract
Running multiple virtual networks, customized for different performance objectives, is a promising way to support diverse applications over a shared substrate. Despite being simple, a static division of resources between virtual networks can be highly inefficient, while dynamic resource allocation runs the risk of instability. This paper uses optimization theory to show that adaptive resource allocation can be stable and can maximize the aggregate performance across the virtual networks. In the DaVinci architecture, each substrate link periodically reassigns bandwidth shares between its virtual links; while at a smaller timescale, each virtual network runs a distributed protocol that maximizes its own performance objective independently. Numerical experiments with a mix of delay-sensitive and throughput-sensitive traffic show that the bandwidth shares converge quickly to the optimal values. We demonstrate that running several custom protocols in parallel and allocating resource adaptively can be more efficient, more flexible, and easier to manage than a compromise one-size-fits-all design.
Jiayue He, Rui Zhang-Shen, Ying Li 0018, Cheng-Yen Lee, Jennifer Rexford, Mung Chiang
CoNEXT4