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Chun-Tsong Wang

dblp:64/6763 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 2002
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Performance modeling and evaluation · 87% Electronic design automation · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Performance modeling and evaluation › simulation › discrete-event simulation
petri net simulation		 0.012002
Modeling and Performance Evaluation for Automated Material Handling Systems in a 300mm Foundry Fab · ICRA 2002
Performance modeling and evaluation
simulation		 0.012002
Modeling and Performance Evaluation for Automated Material Handling Systems in a 300mm Foundry Fab · ICRA 2002
Electronic design automation
semiconductor manufacturing		 0.012002
Modeling and Performance Evaluation for Automated Material Handling Systems in a 300mm Foundry Fab · ICRA 2002

Methods — techniques the papers use, named apart from their topics

virtual tool group · 0.0distributed colored timed petri net · 0.0
YearPublicationVenuePosition
2002 Modeling and Performance Evaluation for Automated Material Handling Systems in a 300mm Foundry Fab
abstract
A modeling methodology for conceptual design of an automated material handling system using a distributed colored timed Petri net (DCTPN) is developed. The IC fabrication process-flow model is constructed and integrated with AMHS models. In IC fabrication process-flow modeling, a method called virtual tool group is proposed to solve the problem in modeling tool-coupling effects. From this entire fab model, several performance indexes, such as WIP, bottleneck detection, cycle time, wafer operation history tracking, and vehicle utilization can be evaluated from the DCTPN simulation result.
Han-Pang Huang, Chun-Tsong Wang
 ICRA2