Demo Data from EDBT 2026 / reviewers in the wild / expert
Daniel B. Jackson
dblp:65/6926
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 1998
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 56% Processor architecture and microarchitecture · 44% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Processor architecture and microarchitecture
microprocessor design |
0.0 | 1 | 1998 | Power Considerations in the Design of the Alpha 21264 Microprocessor · DAC 1998 |
Electronic design automation › physical design
power delivery network design |
0.0 | 1 | 1998 | Power Considerations in the Design of the Alpha 21264 Microprocessor · DAC 1998 |
Electronic design automation › physical design
clock network synthesis |
0.0 | 1 | 1998 | Power Considerations in the Design of the Alpha 21264 Microprocessor · DAC 1998 |
Methods — techniques the papers use, named apart from their topics
electrical design · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1998 | Power Considerations in the Design of the Alpha 21264 MicroprocessorabstractPower dissipation is rapidly becoming a limiting factor in high performance microprocessor design due to ever increasing device counts and clock rates. The 21264 is a third generation Alpha microprocessor implementation, containing 15.2 million transistors and operating at 600 MHz. This paper describes some of the techniques the Alpha design team utilized to help manage power dissipation. In addition, the electrical design of the power, ground, and clock networks is presented. 2. Michael K. Gowan, Larry L. Biro, Daniel B. Jackson |
DAC | 3 |
| 1998 | Testability access of the high speed test features in the Alpha 21264 microprocessorabstractA novel on-chip testability access architecture provides comprehensive tester-driven access to the Alpha 21264 microprocessor's testability features during manufacturing. It also allows simple automatic chip-initiated access that leverages the same features during normal chip operation. The architecture uses the IEEE Std 1149.1 to access all test features by creatively solving a number of problems in accessing the chip's at-speed testability features from an asynchronous test port and slow tester. Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson |
ITC | 4 |