Demo Data from EDBT 2026 / reviewers in the wild / expert
Bob Rychlik
dblp:66/11514
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 2012
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 50% Performance modeling and evaluation · 50% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
design space exploration |
0.1 | 1 | 2012 | Fast cost efficient designs by building upon the plackett and burman method · SIGMETRICS 2012 |
Performance modeling and evaluation › statistical analysis
sensitivity analysis |
0.1 | 1 | 2012 | Fast cost efficient designs by building upon the plackett and burman method · SIGMETRICS 2012 |
Methods — techniques the papers use, named apart from their topics
plackett-burman method · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2012 | Fast cost efficient designs by building upon the plackett and burman methodabstractCPU processor design involves a large set of increasingly complex design decisions, and simulating all possible designs is typically not feasible. Sensitivity analysis, a commonly used technique, can be dependent on the starting point of the design and does not necessarily account for the cost of each parameter. This work proposes a method to simultaneously analyzes multiple parameters with a small number of experiments by leveraging the Plackett and Burman (P&B) analysis method. It builds upon the technique in two specific ways. It allows a parameter to take multiple values and replaces the unit-less impact factor with cost-proportional values. Manish Arora, Feng Wang 0004, Bob Rychlik, Dean M. Tullsen |
SIGMETRICS | 3 |