Demo Data from EDBT 2026 / reviewers in the wild / expert
Flynn Carson
dblp:67/7962 · also Flynn P. Carson
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2009
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 100% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
packaging |
0.1 | 1 | 2009 | 3-D Stacked Package Technology and Trends · Proc. IEEE 2009 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2009 | 3-D Stacked Package Technology and TrendsabstractThe need to integrate more device technology in a given board space for handheld applications such as mobile phones has driven the adoption of innovative packages which stack such devices in the vertical or third dimension (3D). Stacking of device chips in small and thin fine-pitch ball grid array packages has evolved into the stacking of packages themselves to achieve the same end. The advantage of stacking packages rather than device chips is that packages can be fully tested good prior to stacking. There are two primary ways to stack packages to achieve such vertical integration: package-on-package (PoP) and package-in-package (PiP). Innovative variations of PoP and PiP are being developed to address specific packaging needs and market trends. This paper will detail some of the key technology supporting PoP and PiP packages currently in production and the development of new variations of such packages to address future trends. Flynn Carson, Young Cheol Kim, In Sang Yoon |
Proc. IEEE | 1 |