EDBT 2026 Demo / reviewers in the wild / expert
Evelyn L. Thigpen
dblp:69/10970
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1980
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › testability analysis
controllability and observability |
0.0 | 1 | 1980 | SCOAP: Sandia controllability/observability analysis program · DAC 1980 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1980 | SCOAP: Sandia controllability/observability analysis program · DAC 1980 |
Electronic design automation › hardware verification and test
testability analysis |
0.0 | 1 | 1980 | SCOAP: Sandia controllability/observability analysis program · DAC 1980 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1980 | SCOAP: Sandia controllability/observability analysis programabstractSCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program. Lawrence H. Goldstein, Evelyn L. Thigpen |
DAC | 2 |