Demo Data from EDBT 2026 / reviewers in the wild / expert
Bert Maleszka
dblp:69/4306
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 2002
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › technology computer-aided design › process and device simulation
discretization scheme |
0.0 | 1 | 2002 | Renormalization group meshes and the discretization of TCAD equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2002 |
Electronic design automation
technology computer-aided design |
0.0 | 1 | 2002 | Renormalization group meshes and the discretization of TCAD equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2002 |
Electronic design automation › technology computer-aided design
semiconductor device simulation |
0.0 | 1 | 2002 | Renormalization group meshes and the discretization of TCAD equations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2002 |
Methods — techniques the papers use, named apart from their topics
renormalization group meshes · 0.0adaptive meshing · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2002 | Renormalization group meshes and the discretization of TCAD equationsabstractThis paper presents a new method to discretize the equations for the physical modeling of semiconductor devices and back-end patterns. The method assembles planes in two dimensions and cubes in three dimensions and allows for adaptive meshing without the occurrence of spurious nodes due to mesh smoothing. Whereas the applications that are discussed focus on the design of microelectronic devices, the method is generally applicable to all fields of engineering where ab initio physical modeling is required. Wim Schoenmaker, Wim Magnus, Peter Meuris, Bert Maleszka |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 4 |