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D. S. Nydick

dblp:69/5153 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 44% Distributed systems · 44% Performance modeling and evaluation · 13%

Topics — the 2 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › yield analysis
yield simulation
0.011990
DVLASIC: catastrophic fault yield simulation in a distributed processing environment · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990
Performance modeling and evaluation › simulation › architectural simulation
simulation acceleration
0.011990
DVLASIC: catastrophic fault yield simulation in a distributed processing environment · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1990

Methods — techniques the papers use, named apart from their topics

monte carlo simulation · 0.0distributed processing · 0.0
YearPublicationVenuePosition
1990 DVLASIC: catastrophic fault yield simulation in a distributed processing environment
abstract
Simulation of local process disturbances is a computationally intensive task. The VLASIC (VLSI LAyout Simulation for Integrated Circuits) catastrophic-fault yield simulator uses a Monte Carlo method that often requires tens of CPU hours to perform a simulation. In order to reduce the simulation time, DVLASIC, the distributed-environment version developed by the authors, achieves a speedup of 13.3 over VLASIC, with an efficiency of 89%. The authors describe the distributed processing environment and implementation techniques used to obtain this speedup. The distributed processing environment can also be applied to many other CAD problems.>
D. M. H. Walker, D. S. Nydick
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2