Demo Data from EDBT 2026 / reviewers in the wild / expert
Renée C. Estes
dblp:70/3481
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1991
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Computer networks · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Interconnection networks and networks-on-chip · 50% Integrated circuit design · 50% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › packaging
multichip module |
0.0 | 1 | 1991 | Physical Design Issues for Very Large ATM Switching Systems · IEEE J. Sel. Areas Commun. 1991 |
Methods — techniques the papers use, named apart from their topics
physical design analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1991 | Physical Design Issues for Very Large ATM Switching SystemsabstractThe authors examine the physical design issues associated with terabit/second switching systems, particularly with regard to the customer access portion of the switch. They determine the physical design requirements in the areas of backplane interconnections, integrated circuit packaging, and circuit board technology and identify areas where existing- or near-future physical design technologies are inadequate to meet the requirements of this application. A new 3D interconnection architecture that solves some of the problems encountered at the backplane level is suggested. It is also suggested that multichip module technology will help meet some of the speed and density requirements at the chip packaging level. Some of the system-level consequences of the proposed model are discussed.> Thomas C. Banwell, Renée C. Estes, Sarry F. Habiby, Gary A. Hayward, Thomas K. Helstern, Gail Lalk, Derek D. Mahoney, Donald K. Wilson, Kenneth C. Young Jr. |
IEEE J. Sel. Areas Commun. | 2 |