Demo Data from EDBT 2026 / reviewers in the wild / expert
Horng-Yang Chen
dblp:72/2930
· DBLP profile ↗
2ranked-venue papers
1as first author
0since 2021 · last 2000
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Graphics, computer vision, multimedia, augmented reality and games · 1 · 1 first-authorApplied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Interdisciplinary, comprehensive, and emerging computing
1 paper |
Bioinformatics and computational biology · 100% |
Topics — the 1 heaviest of 1, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Bioinformatics and computational biology › bioimage informatics
microarray image analysis |
0.0 | 1 | 2000 | Robust Parametric and Semi-Parametric Spot Fitting for Spot Array Images · ISMB 2000 |
Methods — techniques the papers use, named apart from their topics
semi-parametric fitting · 0.0parametric fitting · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2000 | Robust Spot Fitting for Genetic Spot Array ImagesabstractAddresses the problem of reliably fitting parametric and semi-parametric models to high density spot array images obtained in gene expression experiments. The goal is to measure the amount of genetic material at specific spot locations. Many spots can be modelled accurately by a Gaussian shape. In order to deal with highly overlapping spots the authors use robust M-estimators. When the parametric method fails, they use a novel, robust semi-parametric method which can handle spots of different shapes accurately. They present the results for real data and compare the complexity of the two methods. Horng-Yang Chen, Norbert Brändle, Horst Bischof, Hilmar Lapp |
ICIP | 1 |
| 2000 | Robust Parametric and Semi-Parametric Spot Fitting for Spot Array Images
Norbert Brändle, Horng-Yang Chen, Horst Bischof, Hilmar Lapp |
ISMB | 2 |