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Vineeth Veetil

dblp:72/751 · DBLP profile ↗
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5ranked-venue papers
5as first author
0since 2021 · last 2011
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 5 · 5 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
4 papers
Electronic design automation · 91% GPUs and heterogeneous computing · 5% Integrated circuit design · 4%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › timing analysis › statistical timing analysis
statistical static timing analysis
0.332011
Fast Statistical Static Timing Analysis Using Smart Monte Carlo Techniques · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2011
Efficient smart monte carlo based SSTA on graphics processing units with improved resource utilization · DAC 2010
Efficient Monte Carlo based incremental statistical timing analysis · DAC 2008
Electronic design automation
timing analysis
0.112011
Fast Statistical Static Timing Analysis Using Smart Monte Carlo Techniques · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2011
Electronic design automation › power estimation
statistical leakage analysis
0.112009
Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence · DAC 2009
GPUs and heterogeneous computing
GPU computing
0.012010
Efficient smart monte carlo based SSTA on graphics processing units with improved resource utilization · DAC 2010
Electronic design automation › timing analysis
statistical timing analysis
0.012010
Efficient smart monte carlo based SSTA on graphics processing units with improved resource utilization · DAC 2010
Integrated circuit design › low-power circuit design
leakage power analysis
0.012009
Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence · DAC 2009
Electronic design automation › timing analysis › static timing analysis
incremental timing analysis
0.012008
Efficient Monte Carlo based incremental statistical timing analysis · DAC 2008

Methods — techniques the papers use, named apart from their topics

stratified sampling · 0.3quasi-monte carlo · 0.2hybrid quasi-monte carlo · 0.2graph pruning · 0.1CUDA · 0.1smart sampling · 0.1parallel threads · 0.1
YearPublicationVenuePosition
2011 Fast Statistical Static Timing Analysis Using Smart Monte Carlo Techniques
abstract
In this paper, we propose a stratification+hybrid quasi Monte Carlo (SH-QMC) approach to improve the efficiency of Monte Carlo-based statistical static timing analysis (SSTA) using sample size reduction. Sample size reduction techniques proposed in the literature exhibit a tradeoff between accuracy of the Monte Carlo estimate with fewer samples and their ability to handle large number of variables in multidimensional space. This paper proposes to target several such techniques to different sets of process variation variables by using information about the importance of these variables to the circuit delay, and the capability of the techniques to handle multiple dimensions. Simulations on benchmark circuits up to 90 K gates show that the proposed method requires up to 224 samples for varying levels of process variation to achieve accurate timing estimates. Results also show that when SH-QMC is performed with multiple parallel threads on a quad-core processor, the approach is faster than traditional SSTA with comparable accuracy. When the proposed SH-QMC technique is supplemented with a graph pruning method the runtime is further reduced by 46-48% on average. The technique is also extended to include an incremental approach to recompute a percentile delay metric after engineering change order.
Vineeth Veetil, Kaviraj Chopra, David T. Blaauw, Dennis Sylvester
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
2010 Efficient smart monte carlo based SSTA on graphics processing units with improved resource utilization
abstract
To exploit the benefits of throughput-optimized processors such as GPUs, applications need to be redesigned to achieve performance and efficiency. In this work, we present techniques to speed up statistical timing analysis on throughput processors. We draw upon advancements in improving the efficiency of Monte Carlo based statistical static timing analysis (MC SSTA) using techniques to reduce the sample size or smart sampling techniques. An efficient smart sampling technique, Stratification + Hybrid Quasi Monte Carlo (SH-QMC), is implemented on a GPU based on NVIDIA CUDA architecture. We show that although this application is based on MC analysis with straightforward parallelism available, achieving performance and efficiency on the GPU requires exposing more parallelism and finding locality in computations. This is in contrast with random sampling based algorithms which are inefficient in terms of sample size but can keep resources utilized on a GPU. We show that SH-QMC implemented on a Multi GPU is twice as fast as a single STA on a CPU for benchmark circuits considered. In terms of an efficiency metric, which measures the ability to convert a reduction in sample size to a corresponding reduction in runtime w.r.t a random sampling approach, we achieve 73.9% efficiency with the proposed approaches compared to 4.3% for an implementation involving performing computations on smart samples in parallel. Another contribution of the paper is a critical graph analysis technique to improve the efficiency of Monte Carlo based SSTA, leading to 2--9X further speedup.
Vineeth Veetil, Yung-Hsu Chang, Dennis Sylvester, David T. Blaauw
DAC1
2010 A lower bound computation method for evaluation of statistical design techniques
abstract
Increase in variability in the nanometer era has contributed to pessimistic guardbands for conventional circuit design techniques that optimize at worst-case process corners. Smart deterministic approaches have been proposed that employ statistical timing analysis to reduce pessimism in the guardbands while retaining the deterministic nature of the algorithms. Other statistical optimization techniques focus on algorithms to maximize robustness of design while being aware of variability. It is not clear how much improvement can be gained using the latter set of approaches over more simple deterministic approaches. This work presents a new lower bound to evaluate these statistical optimization techniques, drawing inspiration from recent advances in sampling based SSTA. We prove that the presented lower bound gives the minimum possible area that can be achieved for a design while meeting a particular timing yield, which is the percentage of die that meeting a specified timing constraint. We then compare several statistical design optimization approaches, including one proposed in this paper called SLOP, against the computed lower bound. We show that even the simplest statistical optimization approaches produce area results which are, on average, within 9.6% of the lower bound while the best ones performed only marginally better, reaching within 3.7% of the bound. This demonstrates that the proposed bound is a close bound. In addition, it also shows that the existing optimization methods have nearly exhausted the obtainable improvement from being statistically aware and mostly provide trade-offs in runtime speed.
Vineeth Veetil, Dennis Sylvester, David T. Blaauw
ICCAD1
2009 Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence
abstract
Leakage power minimization is critical to semiconductor design in nanoscale CMOS. On the other hand increasing variability with scaling adds complexity to the leakage analysis problem. In this work we seek to achieve tractability in Monte Carlo-based statistical leakage analysis. A novel approach for fast and accurate statistical leakage analysis considering inter-die and intra-die components is proposed. We show that the optimal way to select samples, to capture intra-die variation accurately, is according to the probability distribution function of total process variation. Intelligent selection of samples is performed using a Quasi Monte Carlo technique. Results are presented for benchmarks with sizes varying from approximately 5,000 to 200,000 gates. The largest benchmark with 198461 gates is evaluated in 3 minutes with the proposed approach compared to 23 hours for random sampling with comparable accuracy. Compared to a conventional analytical approach using Wilkinson's approximation, the proposed technique offers superior accuracy while maintaining efficiency. State dependence and multiple sources of variation are considered and the approach is scalable with number of process parameter variables for standard cell characterization cost. We also show reduction in sample size to meet target accuracy for computing leakage distribution due to the inter-die component only when compared to random selection of samples.
Vineeth Veetil, Dennis Sylvester, David T. Blaauw, Saumil Shah, Steffen Rochel
DAC1
2008 Efficient Monte Carlo based incremental statistical timing analysis
abstract
Modeling and accuracy difficulties exist with traditional SSTA analysis and optimization methods. In this paper we describe methods to improve the efficiency of Monte Carlo-based statistical static timing analysis. We propose a Stratification + Hybrid Quasi Monte Carlo (SH-QMC) approach to reduce the number of samples required for Monte Carlo based SSTA. Our simulations on benchmark circuits up to 90K gates show that the proposed method requires 23.8X fewer samples on average to achieve comparable accuracy in timing estimation as a random sampling approach. Results on benchmark circuits also show that when SH-QMC is performed with multiple parallel threads on a quad core processor, the approach is faster than traditional SSTA with comparable accuracy. SH-QMC scales better than traditional SSTA with circuit size. We also propose an incremental approach to recompute a percentile delay metric after ECO. The results show that on average only 1.4% and 0.7% of original samples need to be evaluated for exact recomputation of the 95th percentile and 99th percentile delays, after sample size reduction using SH-QMC.
Vineeth Veetil, Dennis Sylvester, David T. Blaauw
DAC1