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Michiel Hagedoorn

dblp:74/1655 · DBLP profile ↗
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4ranked-venue papers
4as first author
0since 2021 · last 2003
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 2 · 2 first-authorDatabases, data management, data science and information retrieval · 1 · 1 first-authorTheory of computation · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer graphics and multimedia
1 paper
Image and video processing · 100%
Theoretical computer science
2 papers
Computational geometry · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Image and video processing › image matching
affine invariant matching
0.011999
Reliable and Efficient Pattern Matching Using an Affine Invariant Metric · Int. J. Comput. Vis. 1999
Image and video processing
pattern matching
0.011999
Reliable and Efficient Pattern Matching Using an Affine Invariant Metric · Int. J. Comput. Vis. 1999
Computational geometry › geometric matching
point set matching
0.011997
A General Method for Partial Point Set Matching · SCG 1997
Computational geometry
shape matching
0.011999
Reliable and Efficient Pattern Matching Using an Affine Invariant Metric · Int. J. Comput. Vis. 1999

Methods — techniques the papers use, named apart from their topics

affine-invariant metric · 0.0affine invariant metric · 0.0
YearPublicationVenuePosition
2003 Nearest Neighbors Can Be Found Efficiently If the Dimension Is Small Relative to the Input Size
Michiel Hagedoorn
ICDT1
1999 Reliable and Efficient Pattern Matching Using an Affine Invariant Metric
Michiel Hagedoorn, Remco C. Veltkamp
Int. J. Comput. Vis.1
1999 A Robust Affine Invariant Metric on Boundary Patterns
abstract
Affine invariant pattern metrics are useful for shape recognition. It is important that such a metric is robust for various defects. We formalize these types of robustness using four axioms. Then, we present the reflection metric. This is an affine invariant metric defined for the large family of "boundary patterns". A boundary pattern is a finite union of n-1 dimensional algebraic surface patches in ℝn. Such a pattern may have multiple connected components. We prove that the reflection metric satisfies the four robustness axioms.
Michiel Hagedoorn, Remco C. Veltkamp
Int. J. Pattern Recognit. Artif. Intell.1
1997 A General Method for Partial Point Set Matching
abstract
Article A general method for partial point set matching Share on Authors: Michiel Hagedoorn Utrecht University, Department of Computing Science, Padualaan 14, 3584 CH Utrecht, The Netherlands Utrecht University, Department of Computing Science, Padualaan 14, 3584 CH Utrecht, The NetherlandsView Profile , Remco Veltkamp Utrecht University, Department of Computing Science, Padualaan 14, 3584 CH Utrecht, The Netherlands Utrecht University, Department of Computing Science, Padualaan 14, 3584 CH Utrecht, The NetherlandsView Profile Authors Info & Claims SCG '97: Proceedings of the thirteenth annual symposium on Computational geometryAugust 1997 Pages 406–408https://doi.org/10.1145/262839.263030Published:01 August 1997 5citation510DownloadsMetricsTotal Citations5Total Downloads510Last 12 Months2Last 6 weeks1 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteGet Access
Michiel Hagedoorn, Remco C. Veltkamp
SCG1