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Dennis A. Christenson

dblp:74/4226 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Computer networks · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
1 paper
Software maintenance and evolution · 44% Empirical software engineering · 44% Software testing · 13%

Topics — the 2 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software maintenance and evolution
software inspection
0.011990
Statistical Quality Control Applied to Code Inspections · IEEE J. Sel. Areas Commun. 1990
Empirical software engineering
software metrics
0.011990
Statistical Quality Control Applied to Code Inspections · IEEE J. Sel. Areas Commun. 1990

Methods — techniques the papers use, named apart from their topics

statistical quality control · 0.0control charts · 0.0
YearPublicationVenuePosition
1990 Statistical Quality Control Applied to Code Inspections
abstract
Code inspections have been used on the 5ESS switch project since 1983. Beginning with a training program for all the developers involved in the project, code inspections have improved with each new 5ESS switch generic. Variations on a standard SQC (statistical quality control) technique, the control chart, have been used to track the metrics indicative of the effectiveness of code inspections. Parameters used in the computation of these metrics include the preparation effort, inspection time, number of inspectors, the size of the inspected unit of code, and the number of errors found at the inspection. It is noted that the exact form that these control charts have taken has evolved and improved with experience.>
Dennis A. Christenson, Steel T. Huang, Alfred J. Lamperez
IEEE J. Sel. Areas Commun.1