Demo Data from EDBT 2026 / reviewers in the wild / expert
Markus Emmenegger
dblp:76/2525
· DBLP profile ↗
3ranked-venue papers
0as first author
0since 2021 · last 1999
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2Software engineering, systems software and programming languages · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 63% Integrated circuit design · 15% Performance modeling and evaluation · 11% |
Topics — the 9 heaviest of 9, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
analog and mixed-signal circuits |
0.0 | 1 | 1999 | Equivalent circuit model of resistive IC sensors derived with the box integration method · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Electronic design automation › circuit modeling
equivalent circuit modeling |
0.0 | 1 | 1999 | Equivalent circuit model of resistive IC sensors derived with the box integration method · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
High-performance computing › scientific computing systems
adaptive mesh refinement |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Electronic design automation
boundary element method |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Electronic design automation › physical design
parasitic extraction |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Electronic design automation
physical design |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Performance modeling and evaluation
simulation |
0.0 | 1 | 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulations · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1997 |
Electronic design automation › circuit analysis
symbolic circuit analysis |
0.0 | 1 | 1999 | Equivalent circuit model of resistive IC sensors derived with the box integration method · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999 |
Methods — techniques the papers use, named apart from their topics
symbolic algebra · 0.0mesh discretization · 0.0box integration method · 0.0p-type refinement · 0.0h-type refinement · 0.0error indicator · 0.0boundary element method · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1999 | Smart Enumeration in C++: Virtual Construction, Message Dispatching and TablesabstractThis paper describes a C++ idiom for replacing types. This idiom allows effective and elegant implementations of patterns such as virtual object construction, message dispatching and tables. It also improves compile-time checks and simultaneously allows rows to be added dynamically to tables.SmartEnums have been developed within a project of numerical software for microsystem simulation. Copyright © 1999 John Wiley & Sons, Ltd. Stefano Taschini, Markus Emmenegger, Henry Baltes, Jan G. Korvink |
Softw. Pract. Exp. | 2 |
| 1999 | Equivalent circuit model of resistive IC sensors derived with the box integration methodabstractWe present an automatic method to produce compact equivalent circuit models of spatially inhomogeneous resistors. Local variations in space of the resistivity due to physical interactions such as magnetic fields or mechanical stress are automatically included. The equivalent circuit model is computed using symbolic algebra, such that the functional relation between the resistivity and the fields interacting with it is included in the circuit design model. Modeling is based on the discretization of the sensor geometry with a mesh of elements and vertex nodes together with the current continuity equation using the box integration method. The resistivity is described by the tensor field of electrical conductivity and depends on the physical interactions to be modeled. The element internode conductivity is mapped to a set of lumped conductances and transconductances (voltage controlled current sources) between the nodes of the discretization mesh. These conductances and transconductances are translated into an equivalent circuit net list. Optionally, the electrical network representing the sensor is simplified before translation by symbolic linear algebra. Thus, equivalent circuit models consisting of many simple elements can be generated as well as models with only a few, algebraically complicated elements. The method is demonstrated using the public domain circuit simulator SPICE3 for the example of a magnetic Hall sensor, with and without the piezoresistive effect. Christoph Maier, Markus Emmenegger, Stefano Taschini, Henry Baltes, Jan G. Korvink |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 1997 | An error indicator and automatic adaptive meshing for electrostatic boundary element simulationsabstractAccurate electrostatic simulations are required for the analysis of micro electromechanical systems (MEMS) and interconnects in very large scale integration (VLSI) design. Typical simulations involve complex three-dimensional (3-D) geometries together with various dielectric materials, conductors, and boundary conditions. The boundary element method is well suited for such computations. For highly accurate solutions, the meshing of the geometry becomes increasingly important. A scheme is presented which allows generating an optimal mesh automatically based on a coarse initial discretization, e.g., a CAD model. An error indicator derived from boundary integral equations monitors the solution accuracy in each boundary element. H-type or p-type mesh refinement is applied to areas which contribute strongly to the overall error. The method applies to both two-dimensional (2-D) and 3-D simulations containing elements of various orders and shapes. The generated refined meshes result in significantly higher solution accuracy for a given simulation size. Martin Bächtold, Markus Emmenegger, Jan G. Korvink, Henry Baltes |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |