Hyperspectral imaging is an excellent tool to remotely analyze the Earth from in-orbit devices. Satellites capture these images containing vast information about the ground pixels. To optimize storage and transmission speeds, compression is often performed onboard the satellite. To that end, algorithms such as the CCSDS 123.0-B-2 are implemented on FPGAs, enabling this process in an efficient and fast manner. Single-Event Upsets (SEU) are commonplace in this scenario, e.g. bit flips in the FPGA’s configuration memory which can catastrophically alter the algorithm’s output. In this paper, we propose a fault tolerance technique for this specific case. The compression core is checked periodically by running a golden model designed to excite the full internal datapath based on a synthetic image. A failure in this check will trigger a reconfiguration of the compression core. Results show better detection rates than Dual Modular Redundancy (DMR) at a fraction of the resource cost, proving this technique as a viable alternative. Furthermore, other algorithms with similar processing flows might benefit as well from this technique.

Due to the recent advances in new communication standards, such as 5G New Radio and beyond 5G, and in quantum computing and communications, new requirements for integrating processors into nodes have appeared. These requirements are meant to provide flexibility in the network to reduce operational costs and support diversity in services and load balancing. They are also designed to integrate both new and classical algorithms into efficient and universal platforms, execute specific operations, and attend to tasks with lower latency. Furthermore, some cryptographic algorithms (classical and post-quantum), which are essential to portable devices, share the same arithmetic with error-correction codes. For example, Advanced Encryption Standard (AES), elliptic curve cryptography, Classic McEliece, Hamming Quasi-Cyclic, and Reed-Solomon codes use GF(2^m) arithmetic. As this arithmetic is the basis of many algorithms, a versatile RISC-V Galois field ISA extension is proposed in this work. The RISC-V instruction set extension is implemented and validated using SweRV-EL2 1.3 on a Nexys A7 FPGA. In addition, a five-times acceleration is achieved for AES, Reed-Solomon codes, and Classic McEliece (post-quantum cryptography) at the expense of increasing the logic utilization by 1.27%.

The discrete cosine transform (DCT) is a key building block for many applications in communications and signal processing. Likewise, it is also popular in space applications such as those that perform audio or image compression. The problem with space applications is that they usually have to work in a high radiation environment that affects electronic components and distorts their correct functionality. Therefore, it is usual to devise alternative implementation of the designs that can detect the presence of errors and discard the affected samples. In this brief, we explore the use of algorithmic-based fault tolerance (ABFT) techniques, which exploit certain algorithmic properties to detect errors. In particular, an ABFT technique for the Arai DCT is proposed and compared to standard protection schemes based on modular redundancy. Experimental results show that important savings in terms of resource overhead can be obtained with our approach while still maintaining the error detection rate at a reasonable level.

The use of microprocessors in space missions implies that they should be protected against the effects of cosmic radiation. Commonly this objective has been achieved by applying modular redundancy techniques which provide good results in terms of reliability but increase significantly the number of used resources. Because of that, new protection techniques have appeared, trying to establish a trade-off between reliability and resource utilization. In this paper, we propose an application-based methodology, to protect a soft processor implemented in an SRAM-based FPGA, against the effect of soft errors. This is done creating a library of adaptive protection configurations, based on the profiling of the application. This hardware configuration library, combined with the reprogramming capabilities of the FPGA, helps to create an adaptive protection for each application. We propose two partial TMR configurations for the Arithmetic Logic Unit (ALU) as an example of this methodology. The proposed scheme has been tested in a RISC-V soft processor. A fault injection campaign has been performed to test its reliability.

A translation lookaside buffer (TLB) is a type of cache used to speed up the virtual to physical memory translation process. Instruction TLBs store virtual page numbers and their related physical page numbers for the last accessed pages of instruction memory. TLBs like other memories suffer soft errors that can corrupt their contents. A false positive due to an error produced in the virtual page number stored in the TLB may lead to a wrong translation and, consequently, the execution of a wrong instruction that can lead to a program hard fault or to data corruption. Parity or error correction codes have been proposed to provide protection for the TLB, but they require additional storage space. This paper presents some schemes to increase the instruction TLB resilience to this type of errors without requiring any extra storage space, by taking advantage of the spatial locality principle that takes place when executing a program.

Soft errors are an important issue for SRAM-based Field Programmable Gate Arrays (FPGAs), since they result in permanent alterations of the mapped circuit when they affect their configuration memory. Concurrent Error Detection (CED) techniques, such as Dual Modular Redundancy (DMR), are usually employed to detect errors that affect the performance of the circuit. When trying to detect errors produced on the complex Fast Fourier Transform (FFT), the Parseval Sum of Squares (SoS) is a widely used technique. In this paper, we present a scheme to implement CED techniques for the complex FFT implemented in SRAM-based FPGAs. These techniques perform checks based on the relationships existing between one or more of the inputs and the outputs of the algorithm. Three examples of these techniques are provided to further clarify how to construct them. These techniques, along with DMR and SoS, have been tested through fault injection. An analysis on their error detection capabilities shows that they achieve high detection rates with much less resource usage than DMR and SoS. In addition, the number of false error detections for these techniques is lower than that of SoS, which leads to less unnecessary reconfigurations of the device.

Soft-processors implemented on SRAM-based FPGAs are increasingly being adopted in on-board computing for space and avionics applications due to their flexibility and ease of integration. However, efficient component-level protection techniques for these processors against radiation-induced upsets are necessary otherwise as system failures could manifest. A register file is one of the critical structures that stores vital information the processor uses related to user computations and program execution. In this paper, we present a fault tolerance technique for the register file of a microprocessor implemented in Xilinx SRAM-based FPGAs. The proposed scheme leverages the inherent implementation redundancy created by the FPGA design automation tools when mapping the register file to on-chip distributed memory. A parity-based error detection and switching logic are added for fault masking against single-bit errors. The proposed scheme has been implemented and evaluated in lowRISC, a RISC-V ISA soft-processor implementation. The effectiveness of the proposed scheme was tested using fault injection. The fault masking overhead required in terms of FPGA resources was much lower than a traditional Triple Modular Redundancy protection. Therefore, the proposed scheme is an interesting option to protect the register file of soft processors that are implemented in Xilinx FPGAs.

Parallel matrix processing is a typical operation in many systems, and in particular matrix-vector multiplication (MVM) is one of the most common operations in the modern digital signal processing and digital communication systems. This paper proposes a fault-tolerant design for integer parallel MVMs. The scheme combines ideas from error correction codes with the self-checking capability of MVM. Field-programmable gate array evaluation shows that the proposed scheme can significantly reduce the overheads compared to the protection of each MVM on its own. Therefore, the proposed technique can be used to reduce the cost of providing fault tolerance in practical implementations.

Content-addressable memories (CAMs) are a type of memory that receives an input search key and compares it to every entry of a table of stored keys. If there is a match, they return the corresponding address where the value was found. Alternatively, they can include a related Random Access Memory (RAM) that is accessed with the matching address, returning the corresponding data values. To protect a CAM with associated RAM against errors, parity or error-correction codes (ECCs) are typically used. They usually protect the CAM and the RAM information separately incurring in additional storage needs. This paper proposes a scheme to protect some configurations of CAM with its associated RAM from errors with a single ECC code. This ECC code can be used to provide advanced error correction to the combination of the key and data values stored in the CAM and the RAM, but it can also be applied in a modular way to provide simpler protection to the key or to the values individually.

Bloom filters have been used to reduce the delay in networking and computing applications when a set membership check is to be applied. Error sources can affect the behavior of Bloom filters resulting in a wrong outcome of this membership test and a possible effect in the system's output. Single event transients are a type of temporary errors altering the operation of combinational logic. A single event transient affecting the hash generation logic of a hardware-implemented Bloom filter can produce errors such as false negatives. This paper presents different approaches to build Bloom filters that are tolerant to single event transients occurring in the hash generation circuitry. They are compared to the use of traditional Modular Redundancy approaches. The results show that the new schemes can reduce significantly the circuit area needed to implement the Bloom filter.

The use of error-correcting codes is a common strategy to protect memories from errors. Single-error correction, double-error detection linear block codes have been traditionally utilized. However, there are applications where multiple errors are frequent and more complex codes are needed. Orthogonal Latin square codes are one type of codes with multiple-error-correction capability. They are of interest for memory protection because they can be decoded with low complexity and delay. This paper presents a modification to orthogonal Latin square codes that reduces the number of parity check bits to be stored in memory therefore lowering the memory overhead needed to implement the codes. The proposed codes can also be decoded with low delay and complexity. This paper also presents an evaluation of the encoder and decoder implementations for various word sizes and compares them with the standard orthogonal Latin square implementations. The results show that they are similar in terms of circuit area and introduce only a small penalty in delay.

Parallel matrix processing is a typical operation in many systems, and in particular matrix-vector multiplication is one of the most common operations in modern digital signal processing and digital communication systems. This paper proposes a fault tolerant design for parallel matrix-vector multiplications. The scheme combines ideas from Error Correction Codes with the self-checking capability of matrix-vector multiplication.

In recent years, there has been a growing interest in multi-bit error correction codes (ECCs) to protect SRAM memories. This has been caused by the increased number of multiple errors that memories suffer as technology scales. To be suitable to protect an SRAM memory, an ECC has to be decodable in parallel and with low latency. Among the codes proposed for memory protection are orthogonal latin square (OLS) codes that provide low latency decoding and a modular construction. For some applications, like multimedia or signal processing, the effect of errors on the memory bits can be very different depending on their position on the word. Therefore, in these cases, it is more effective to provide different degrees of error correction for the different bits. This is done with unequal error protection (UEP) codes. In this paper, UEP codes are derived from double error correction (DEC) OLS codes. The derived codes are implemented for an FPGA platform to evaluate the decoder complexity and latency. The results show that the new codes can be implemented with lower decoding delay than traditional SEC-DED codes and with a cost similar to that of both DEC OLS and SEC-DED codes.

Cuckoo hashing has proven to be an efficient option to implement exact matching in networking applications. It provides good memory utilization and deterministic worst case access time. The continuous increase in speed and complexity of networking devices creates a need for higher throughput exact matching in many applications. In this paper, a new Cuckoo hashing implementation named parallel d-pipeline is proposed to increase throughput. The scheme presented is targeted to implementations in which the tables are accessed in parallel. A parallel implementation increases the throughput and therefore is well suited to high speed applications. Parallel schemes are common for ASIC/FPGA implementations in which the tables are stored in several embedded memories. Using the proposed technique, the throughput can be significantly increased with gains that in practical scenarios can reach 60 percent compared to existing parallel implementations. The new scheme has been evaluated using a case study and detailed results for performance and implementation costs are reported.

A Bloom filter is a data structure that provides probabilistic membership checking. Bloom filters have many applications in computing and communications systems. The performance of a Bloom filter is measured by false positive rate, memory size requirement, and query (or memory look-up) overhead. A recent paper by Qiao et al. proposes the Fast Bloom Filter, also called Bloom-1, which requires only a single memory look-up for a membership test. Bloom-1 achieves a reduced query overhead at the expense of a slightly higher false positive rate for a given memory size. The false positive rate of Bloom-1 has been analyzed theoretically by Qiao et al. relying on a well-known, but flawed, approximation for the false positive rate for a Bloom filter. In this comment paper we show that the Qiao et al. analysis of Bloom-1 under-estimates the false positive rate for low loads. We provide a correct analysis of Bloom-1 yielding an expression for the exact false positive rate.

Soft errors pose a reliability threat to modern electronic circuits. This makes protection against soft errors a requirement for many applications. Communications and signal processing systems are no exceptions to this trend. For some applications, an interesting option is to use algorithmic-based fault tolerance (ABFT) techniques that try to exploit the algorithmic properties to detect and correct errors. Signal processing and communication applications are well suited for ABFT. One example is fast Fourier transforms (FFTs) that are a key building block in many systems. Several protection schemes have been proposed to detect and correct errors in FFTs. Among those, probably the use of the Parseval or sum of squares check is the most widely known. In modern communication systems, it is increasingly common to find several blocks operating in parallel. Recently, a technique that exploits this fact to implement fault tolerance on parallel filters has been proposed. In this brief, this technique is first applied to protect FFTs. Then, two improved protection schemes that combine the use of error correction codes and Parseval checks are proposed and evaluated. The results show that the proposed schemes can further reduce the implementation cost of protection.

Memories that operate in harsh environments, like for example space, suffer a significant number of errors. The error correction codes (ECCs) are routinely used to ensure that those errors do not cause data corruption. However, ECCs introduce overheads both in terms of memory bits and decoding time that limit speed. In particular, this is an issue for applications that require strong error correction capabilities. A number of recent works have proposed advanced ECCs, such as orthogonal Latin squares or difference set codes that can be decoded with relatively low delay. The price paid for the low decoding time is that in most cases, the codes are not optimal in terms of memory overhead and require more parity check bits. On the other hand, codes like the (24,12) Golay code that minimize the number of parity check bits have a more complex decoding. A compromise solution has been recently explored for Bose-Chaudhuri-Hocquenghem codes. The idea is to implement a fast parallel decoder to correct the most common error patterns (single and double adjacent) and use a slower serial decoder for the rest of the patterns. In this brief, it is shown that the same scheme can be efficiently implemented for the (24,12) Golay code. In this case, the properties of the Golay code can be exploited to implement a parallel decoder that corrects single- and double-adjacent errors that is faster and simpler than a single-error correction decoder. The evaluation results using a 65-nm library show significant reductions in area, power, and delay compared with the traditional decoder that can correct single and double-adjacent errors. In addition, the proposed decoder is also able to correct some triple-adjacent errors, thus covering the most common error patterns.

Single error correction and double-adjacent error correction (SEC-DAEC) codes are a type of error correction codes (ECCs) capable of correcting single and double-adjacent errors. They are useful in applications where multiple adjacent errors may occur, such as space or avionics. ECC encoders and decoders have a regular structure that makes it easier to accommodate them into field-programmable gate arrays (FPGAs). This brief proposes methods to optimize the decoder of SEC-DAEC codes when implemented in an FPGA, reducing the resource utilization when compared with the conventional implementations.

To avoid data corruption, error correction codes (ECCs) are widely used to protect memories. ECCs introduce a delay penalty in accessing the data as encoding or decoding has to be performed. This limits the use of ECCs in high-speed memories. This has led to the use of simple codes such as single error correction double error detection (SEC-DED) codes. However, as technology scales multiple cell upsets (MCUs) become more common and limit the use of SEC-DED codes unless they are combined with interleaving. A similar issue occurs in some types of memories like DRAM that are typically grouped in modules composed of several devices. In those modules, the protection against a device failure rather than isolated bit errors is also desirable. In those cases, one option is to use more advanced ECCs that can correct multiple bit errors. The main challenge is that those codes should minimize the delay and area penalty. Among the codes that have been considered for memory protection are Reed-Solomon (RS) codes. These codes are based on non-binary symbols and therefore can correct multiple bit errors. In this paper, single symbol error correction codes based on Reed-Solomon codes that can be implemented with low delay are proposed and evaluated. The results show that they can be implemented with a substantially lower delay than traditional single error correction RS codes.

Digital filters are widely used in signal processing and communication systems. In some cases, the reliability of those systems is critical, and fault tolerant filter implementations are needed. Over the years, many techniques that exploit the filters' structure and properties to achieve fault tolerance have been proposed. As technology scales, it enables more complex systems that incorporate many filters. In those complex systems, it is common that some of the filters operate in parallel, for example, by applying the same filter to different input signals. Recently, a simple technique that exploits the presence of parallel filters to achieve fault tolerance has been presented. In this brief, that idea is generalized to show that parallel filters can be protected using error correction codes (ECCs) in which each filter is the equivalent of a bit in a traditional ECC. This new scheme allows more efficient protection when the number of parallel filters is large. The technique is evaluated using a case study of parallel finite impulse response filters showing the effectiveness in terms of protection and implementation cost.

Radiation-induced soft errors are a major reliability concern for memories. To ensure that memory contents are not corrupted, single error correction double error detection (SEC-DED) codes are commonly used, however, in advanced technology nodes, soft errors frequently affect more than one memory bit. Since SEC-DED codes cannot correct multiple errors, they are often combined with interleaving. Interleaving, however, impacts memory design and performance and cannot always be used in small memories. This limitation has spurred interest in codes that can correct adjacent bit errors. In particular, several SEC-DED double adjacent error correction (SEC-DED-DAEC) codes have recently been proposed. Implementing DAEC has a cost as it impacts the decoder complexity and delay. Another issue is that most of the new SEC-DED-DAEC codes miscorrect some double nonadjacent bit errors. In this brief, a new class of SEC-DED-DAEC codes is derived from orthogonal latin squares codes. The new codes significantly reduce the decoding complexity and delay. In addition, the codes do not miscorrect any double nonadjacent bit errors. The main disadvantage of the new codes is that they require a larger number of parity check bits. Therefore, they can be useful when decoding delay or complexity is critical or when miscorrection of double nonadjacent bit errors is not acceptable. The proposed codes have been implemented in Hardware Description Language and compared with some of the existing SEC-DED-DAEC codes. The results confirm the reduction in decoder delay.

Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a set. The BFs are used in numerous applications, for example, in communications and networking. There is also ongoing research to extend and enhance BFs and to use them in new scenarios. Reliability is becoming a challenge for advanced electronic circuits as the number of errors due to manufacturing variations, radiation, and reduced noise margins increase as technology scales. In this brief, it is shown that BFs can be used to detect and correct errors in their associated data set. This allows a synergetic reuse of existing BFs to also detect and correct errors. This is illustrated through an example of a counting BF used for IP traffic classification. The results show that the proposed scheme can effectively correct single errors in the associated set. The proposed scheme can be of interest in practical designs to effectively mitigate errors with a reduced overhead in terms of circuit area and power.

Static random access memories (SRAMs) are key in electronic systems. They are used not only as standalone devices, but also embedded in application specific integrated circuits. One key challenge for memories is their susceptibility to radiation-induced soft errors that change the value of memory cells. Error correction codes (ECCs) are commonly used to ensure correct data despite soft errors effects in semiconductor memories. Single error correction/double error detection (SEC-DED) codes have been traditionally the preferred choice for data protection in SRAMs. During the last decade, the percentage of errors that affect more than one memory cell has increased substantially, mainly due to multiple cell upsets (MCUs) caused by radiation. The bits affected by these errors are physically close. To mitigate their effects, ECCs that correct single errors and double adjacent errors have been proposed. These codes, known as single error correction/double adjacent error correction (SEC-DAEC), require the same number of parity bits as traditional SEC-DED codes and a moderate increase in the decoder complexity. However, MCUs are not limited to double adjacent errors, because they affect more bits as technology scales. In this brief, new codes that can correct triple adjacent errors and 3-bit burst errors are presented. They have been implemented using a 45-nm library and compared with previous proposals, showing that our codes have better error protection with a moderate overhead and low redundancy.

Error correction codes (ECCs) are commonly used to protect memories from errors. As multibit errors become more frequent, single error correction codes are not enough and more advanced ECCs are needed. The use of advanced ECCs in memories is, however, limited by their decoding complexity. In this context, one-step majority logic decodable (OS-MLD) codes are an interesting option as the decoding is simple and can be implemented with low delay. Orthogonal Latin squares (OLS) codes are OS-MLD and have been recently considered to protect caches and memories. The main advantage of OLS codes is that they provide a wide range of choices for the block size and the error correction capabilities. In this brief, a method to extend OLS codes is presented. The proposed method enables the extension of the data block size that can be protected with a given number of parity bits thus reducing the overhead. The extended codes are also OS-MLD and have a similar decoding complexity to that of the original OLS codes. The proposed codes have been implemented to evaluate the circuit area and delay needed for different block sizes.

This paper studies the problem of designing a low complexity Concurrent Error Detection (CED) circuit for the complex multiplication function commonly used in Digital Signal Processing circuits. Five novel CED architectures are proposed and their computational complexity, area, and delay evaluated in several circuit implementations. The most efficient architecture proposed reduces the number of gates required by up to 30 percent when compared with a conventional CED architecture based on Dual Modular Redundancy. Compared to a Residue Code CED scheme, the area of the proposed architectures is larger. However, for some of the proposed CEDs delay is significantly lower with reductions exceeding 30 percent in some configurations.

Error correction codes (ECCs) have been used for decades to protect memories from soft errors. Single error correction (SEC) codes that can correct 1-bit error per word are a common option for memory protection. In some cases, SEC codes are extended to also provide double error detection and are known as SEC-DED codes. As technology scales, soft errors on registers also became a concern and, therefore, SEC codes are used to protect registers. The use of an ECC impacts the circuit design in terms of both delay and area. Traditional SEC or SEC-DED codes developed for memories have focused on minimizing the number of redundant bits added by the code. This is important in a memory as those bits are added to each word in the memory. However, for registers used in circuits, minimizing the delay or area introduced by the ECC can be more important. In this paper, a method to construct low delay SEC or SEC-DED codes that correct errors only on the data bits is proposed. The method is evaluated for several data block sizes, showing that the new codes offer significant delay reductions when compared with traditional SEC or SEC-DED codes. The results for the area of the encoder and decoder also show substantial savings compared to existing codes.

Different techniques have been used to deal with defects and soft errors. Repair techniques are commonly used for defects, while error correction codes are used for soft errors. Recently, some proposals have been made to use error correction codes to deal with defects. In this paper, we analyze the impact on reliability of such approaches that use error correction codes, which in addition to soft errors can resolve defects, at the cost of reduced ability to correct soft errors. The results showed that low defect rates or small memory sizes are required to have a low impact on reliability. Additionally, a technique that can improve reliability is proposed and analyzed. The results show that our new approach can achieve a similar reliability in terms of time to failure as that of a defect free memory at the cost of a more complex decoding algorithm.

In a recent paper, a method was proposed to accelerate the majority logic decoding of difference set low density parity check codes. This is useful as majority logic decoding can be implemented serially with simple hardware but requires a large decoding time. For memory applications, this increases the memory access time. The method detects whether a word has errors in the first iterations of majority logic decoding, and when there are no errors the decoding ends without completing the rest of the iterations. Since most words in a memory will be error-free, the average decoding time is greatly reduced. In this brief, we study the application of a similar technique to a class of Euclidean geometry low density parity check (EG-LDPC) codes that are one step majority logic decodable. The results obtained show that the method is also effective for EG-LDPC codes. Extensive simulation results are given to accurately estimate the probability of error detection for different code sizes and numbers of errors.

Error correction codes (ECCs) are commonly used to protect memories against errors. Among ECCs, orthogonal latin squares (OLS) codes have gained renewed interest for memory protection due to their modularity and the simplicity of the decoding algorithm that enables low delay implementations. An important issue is that when ECCs are used, the encoder and decoder circuits can also suffer errors. In this brief, a concurrent error detection technique for OLS codes encoders and syndrome computation is proposed and evaluated. The proposed method uses the properties of OLS codes to efficiently implement a parity prediction scheme that detects all errors that affect a single circuit node.

Technology advances have recently enabled the use of DRAMs into logic integrated circuits. These embedded DRAMs can be used to efficiently implement caches since DRAMs require substantially less area than SRAMs. One challenge for DRAM based caches is that a small time between refreshes is needed to ensure data retention. These refreshes increase the power consumption even when the cache is idle. To mitigate this issue, the use of longer times between refreshes combined with the use of Error Correction Codes (ECCs) has been recently proposed. The idea is that the time between refreshes can be increased significantly while only causing data retention failures on a small percentage of the cells. Then those errors can be corrected by the ECC. For this scheme to be efficient the number of additional bits required by the ECC should be small. This is achieved by using large data blocks for the ECC which in turns means that a large data block has to be accessed even when only a small portion of it is needed. This has no effect on idle power consumption but increases the dynamic power consumption and reduces the effective memory bandwidth. In this paper, a technique to mitigate this issue is proposed. It enables better granularity in the read data accesses by partitioning the ECC block into two sub-blocks and modifying the error detection and correction processes. This reduces the dynamic power consumption and increases the available memory bandwidth while requiring only a moderate increase in the number of additional bits.

Nowadays, single event upsets (SEUs) altering digital circuits are becoming a bigger concern for memory applications. This paper presents an error-detection method for difference-set cyclic codes with majority logic decoding. Majority logic decodable codes are suitable for memory applications due to their capability to correct a large number of errors. However, they require a large decoding time that impacts memory performance. The proposed fault-detection method significantly reduces memory access time when there is no error in the data read. The technique uses the majority logic decoder itself to detect failures, which makes the area overhead minimal and keeps the extra power consumption low.

In this paper, we propose the use of ad-hoc scrubbing sequences to improve memory reliability. The key idea is to exploit the locality of the errors caused by a Multiple Cell Upset (MCU) to make scrubbing more efficient. The starting point is the MCU distributions for a given device. A procedure is presented that uses that information to determine an ad-hoc scrubbing sequence that maximizes reliability. The approach is then applied to a case study and results show a significant increase in the Mean Time To Failure (MTTF) compared with traditional scrubbing.

A methodology based on optimization processes and software fault injection is presented to verify and improve TMR protection against SEUs. It allows validating the reliability achieved by the protection, optimizing the solution area cost.

A novel concurrent soft error detection and correction scheme is introduced for parallel hardware implementations of transform-based convolution. The proposed technique is based on the structure of radix-2 Fast Fourier Transforms (FFT) of length 2nwhere n is an integer. The scheme can provide up to 100 percent detection and correction of isolated single soft errors in the convolution at the cost of little more than double the system area, rather than triple, as is required when using conventional Triple Modular Redundancy (TMR).

Reliability is a critical issue for memories. Radiation particles that hit the device can cause errors in some cells, which can lead to data corruption. To avoid this problem, memories are protected with per-word error correction codes (ECCs). Typically, single-error correction and double-error detection (SEC-DED) codes are used. As technology scales, errors caused by radiation particles on memories tend to affect more than one cell—what is known as a multiple cell upset (MCU). To ensure that only a single cell is affected in each word, interleaving is used. With interleaving, cells that belong to the same word are placed at a sufficient distance such that an MCU will only affect a single cell on each word. The use of interleaving significantly increases the cost of the device. Also, determining the interleaving distance (ID) required to avoid MCUs causing double errors is not trivial. Typically, accelerated radiation experiments with a limited number of particle hits are used. They provide a lower bound on the required ID, but larger MCUs may occur with a low probability. But even if the percentage of such large MCUs is very low, the impact on reliability can be significant. This article presents a technique to mitigate the effects of large MCUs that is, those that exceed the ID, on memory reliability. The proposed approach is able to correct most double errors caused by large MCUs by exploiting the locality of the errors within an MCU.

This article presents an analysis of the reliability of memories protected with Built-in Current Sensors (BICS) and a per-word parity bit when exposed to Single Event Upsets (SEUs). Reliability is characterized by Mean Time to Failure (MTTF) for which two analytic models are proposed. A simple model, similar to the one traditionally used for memories protected with scrubbing, is proposed for the low error rate case. A more complex Markov model is proposed for the high error rate case. The accuracy of the models is checked using a wide set of simulations. The results presented in this article allow fast estimation of MTTF enabling design of optimal memory configurations to meet specified MTTF goals at minimum cost. Additionally the power consumption of memories protected with BICS is compared to that of memories using scrubbing in terms of the number of read cycles needed in both configurations.

The structure of radix-2 Fast Fourier Transforms of length 2nwhere n is an integer is used to propose a new soft error detection and correction scheme for transform based convolution. The scheme can provide up to 100% detection and correction of isolated soft errors for, in many cases, approximately double the original system cost in terms of area and/or computational complexity. This is a substantial reduction when compared with conventional Triple Modular Redundancy. The method can be used for both hardware and software implementations of transform-based convolution.

Memories are one of the most widely used elements in electronic systems, and their reliability when exposed to Single Events Upsets (SEUs) has been studied extensively. As transistor sizes shrink, Multiple Bits Upsets (MBUs) are becoming an increasingly important factor in the reliability of memories exposed to radiation effects. To address this issue, Built-in Current Sensors (BICS) have recently been applied in conjunction with Single Error Correction/Double Error Detection (SEC-DED) codes to protect memories from MBUs. In this article, this approach is taken one step further, proposing specific codes optimized to be combined with BICS to provide protection against MBUs in memories. By exploiting the locality of errors within an MBU and the error detection and location capabilities of BICS, the proposed codes result in both a better protection level and a reduced cost compared with the existing SEC-DED approach.

Reliability is a critical factor for systems operating in radiation environments. Among the different components in a system, memories are one of the parts most sensitive to soft errors due to their relatively large area. Due to their large cost, traditional techniques like triple modular redundancy are not used to protect memories. A typical approach is to apply error correction codes to correct single errors, and detect double errors. This type of codes, for example those based on Hamming, provides an initial level of protection. Detected single errors are usually corrected using scrubbing, by which the memory positions are periodically re-written after a fixed (deterministic scrubbing), or variable period (probabilistic scrubbing). These traditional models usually offer good results when calculating the reliability of memories (e.g. through the mean time to failure). However, there are some particularities that are not modeled through these approaches, to the best of our knowledge. One of these particularities is how double errors are handled. In a traditional approach, two errors in the same word produce always a system failure (only single errors can be corrected). However, if the two (or more) errors affect the same bit, either the second one reinforces the first one (keeping just a single error), or corrects it. In both scenarios, the resulting situation does not trigger a system failure, which has a direct impact on the reliability of the memory. In this paper, traditional reliability models are refined to handle the mentioned scenarios, which produces a more precise analysis in the calculation of mean time to failure for memory systems.

Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event Upsets (SEUs), Multiple Bit Upsets (MBUs) are becoming more and more important as technology scales. In this paper, a model that deals with MBUs in memory systems, which allows calculating reliability in a fast way similar to the SEU case, has been used to analyze the Mean Time To Failure (MTTF) of a 150 nm device under radiation. This analysis illustrates the importance that physical factors, as the energy, have on the system reliability.

As the codesign problems become more and more complex, characterizing the scheduling and allocation details of the tasks with macroscopic magnitudes which are easy to handle, can help to solve them in an efficient way.

This paper describes a method to estimate the implementation cost of the hardware part in a mixed hardware/software system, as well as the related performance. These estimations try to avoid the use of many implementation details in order to keep the complexity order of the process under control. The concepts of hardware sharing and parallelism are exploited to make a picture of the whole hardware cost associated with a given partition.