Electromagnetic Fault Injection (EMFI) has been demonstrated to be useful for both academic and industrial research. Due to the dangerous voltages involved, most work is done with commercial tools. This paper introduces a safety-focused low-cost and open-source design that can be built for less than $50 using only off-the-shelf parts. The paper also introduces an iCE40 based Time-to-Digital Converter (TDC), which is used to visualize the glitch inserted by the EMFI tool. This demonstrates the internal voltage perturbations between voltage, body biasing injection (BBI), and EMFI all result in similar waveforms. In addition, a link between an easy-to-measure external voltage measurement and the internal measurement is made. Attacks are also made on a hardware AES engine, and a soft-core RISC-V processor, all running on the same iCE40 FPGA. The platform is used to demonstrate several aspects of fault injection, including that the spatial positioning of the EMFI probe can impact the glitch strength, and that the same physical device may require widely different glitch parameters when running different designs.

Faults occur naturally and are responsible for reliability concerns. Faults are also an interesting tool for attackers to extract sensitive information from secure chips. In particular, non-invasive fault attacks have received a fair amount of attention. One easy way to perturb a chip without altering it is the so-called Electromagnetic Fault Injection (EMFI). Such attack has been studied in great depth, and nowadays, it is part and parcel of the state-of-the-art. Indeed, new capabilities have emerged where EM experimental benches are used to cryptanalyze chips. The progress of this “field” is fast, in terms ofreproducibility,accuracy, andnumber of use-cases. However, there is too little awareness about such advances. In this paper, we aim to expose the true harmfulness of EMFI (including reproducibility) to enable reasonable security quotations. We also analyze protections (at hardware/firmware/system levels) in light of their efficiency. We characterize the specificity of EM fault injection compared to other injection means (laser, glitch, probing).

Electromagnetic Fault Injection (EMFI) is a well known method of introducing faults for security analysis of digital devices. Such faults can be seen as analogous to the faults which are known to naturally occur in digital devices, a known problem with designing safety-critical systems.Numerous standards have been developed for safety-critical systems, including the development of standards for increasing the rate of naturally occurring faults using particle sources. In this work, we demonstrate that desktop EMFI tooling can be used to accomplish similar testing, but with more control, effectively speeding up the evaluation process.We demonstrate using EMFI tooling for safety evaluation to recreate a highly publicized safety issue present in an automotive ECU – one that could not easily be recreated with other techniques.

Within the next few years, billions of IoT devices will densely populate our cities. In this paper we describe a new type of threat in which adjacent IoT devices will infect each other with a worm that will rapidly spread over large areas, provided that the density of compatible IoT devices exceeds a certain critical mass. In particular, we developed and verified such an infection using the popular Philips Hue smart lamps as a platform. The worm spreads by jumping directly from one lamp to its neighbors, using only their built-in ZigBee wireless connectivity and their physical proximity. The attack can start by plugging in a single infected bulb anywhere in the city, and then catastrophically spread everywhere within minutes. It enables the attacker to turn all the city lights on or off, to permanently brick them, or to exploit them in a massive DDOS attack. To demonstrate the risks involved, we use results from percolation theory to estimate the critical mass of installed devices for a typical city such as Paris whose area is about 105 square kilometers: The chain reaction will fizzle if there are fewer than about 15,000 randomly located smart lamps in the whole city, but will spread everywhere when the number exceeds this critical mass (which had almost certainly been surpassed already). To make such an attack possible, we had to find a way to remotely yank already installed lamps from their current networks, and to perform over-the-air firmware updates. We overcame the first problem by discovering and exploiting a major bug in the implementation of the Touchlink part of the ZigBee Light Link protocol, which is supposed to stop such attempts with a proximity test. To solve the second problem, we developed a new version of a side channel attack to extract the global AES-CCM key (for each device type) that Philips uses to encrypt and authenticate new firmware. We used only readily available equipment costing a few hundred dollars, and managed to find this key without seeing any actual updates. This demonstrates once again how difficult it is to get security right even for a large company that uses standard cryptographic techniques to protect a major product.

With emerging IPv6-based standards such as 6LowPAN and ISA100a, full IPv6 sensor networks are the next major step. With millions of deployed embedded IPv6 devices, interoperability is of major importance, both within the sensor networks and between the sensors and the Internet hosts. We present uIPv6, the first IPv6 stack for memory-constrained devices that passes all Phase-1 IPv6 Ready certification tests. This is an important step for end-to-end interoperability between IPv6 sensors and any IPv6 capable device. To allow widespread community adoption, we release uIPv6 under a permissive open source license that allows both commercial and non-commercial use.