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Anastasios Vergis

dblp:77/3573 · DBLP profile ↗
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7ranked-venue papers
4as first author
0since 2021 · last 1996
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 5 · 4 first-authorTheory of computation · 1Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
5 papers
Electronic design automation · 78% Integrated circuit design · 14% Parallel and multicore computing · 7%
Theoretical computer science
2 papers
Computational complexity · 76% Automata and formal languages · 24%

Topics — the 14 heaviest of 15, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.041993
On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992
C-Testability of Two-Dimensional Iterative Arrays · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986
Electronic design automation › hardware verification and test › combinational circuit testing
iterative logic array testing
0.021992
On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992
Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986
Integrated circuit design
digital circuit design
0.011993
On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
Electronic design automation › hardware verification and test
fault testing
0.011993
On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
Parallel and multicore computing
parallel computation models
0.011988
On the power of one-way communication · J. ACM 1988
Computational complexity
communication complexity
0.011988
On the power of one-way communication · J. ACM 1988
Computational complexity › communication complexity › bounded-round protocols
one-way communication
0.011988
On the power of one-way communication · J. ACM 1988
Electronic design automation › hardware verification and test › testability improvement
c-testability
0.011986
C-Testability of Two-Dimensional Iterative Arrays · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986
Automata and formal languages
cellular automata
0.011986
On the Power of One-Way Communication · FOCS 1986
Computational complexity › computational models
parallel computation models
0.011986
On the Power of One-Way Communication · FOCS 1986
Electronic design automation › hardware verification and test › test generation
test sequence generation
0.011992
On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992
Electronic design automation › high-level synthesis › digital filter design
FIR filter synthesis
0.011986
Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986
Hardware accelerators and domain-specific architectures
systolic array
0.011986
Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986
Automata and formal languages › language recognition
formal language recognition
0.011986
On the Power of One-Way Communication · FOCS 1986

Methods — techniques the papers use, named apart from their topics

fault modeling · 0.0reduction · 0.0testability analysis · 0.0test vector generation · 0.0test sequence generation · 0.0state machine simulation · 0.0iterative array testing · 0.0
YearPublicationVenuePosition
1996 Testing trees for multiple faults
abstract
A "well behaving" property is defined for each line (in general a bundle of wires) connecting two combinational logic cells. This property can be easily taken into account in the design process of the circuit. It is shown that all tree-structured circuits of combinational logic cells are easily testable for multiple faults if each line is "well behaving". The size of the test set increases only linearly as the number of cells increases. It is also shown that if no line is well-behaving then only the trivial (exhaustive) test set exists for the circuit, which increases exponentially as the number of cells increases. If there are well-behaving as well as non-well-behaving lines in the circuit, then the size of the test set increases exponentially with the sizes of the non-well-behaving subtrees and linearly with the number of such subtrees.
Anastasios Vergis, Carlos Tobon 0002
VTS1
1993 On the multiple-fault testability of generalized counters
abstract
It is shown that any generalized counter of full-adder cells is testable for multiple faults with a test set of size proportional to the number of cells. Any number of cells can be faulty in any way, as long as the faults are permanent, the cells remain combinational, and no signal values other than 0 and 1 are generated.>
Anastasios Vergis
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1992 On the Testability of One-Dimensional ILA's for Multiple Sequential Faults
abstract
It is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m/sup 2/n/sup 2/+mn/sup 3/)*K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K>
Anastasios Vergis
IEEE Trans. Computers1
1988 On the power of one-way communication
abstract
In this paper, a very simple model of parallel computation is considered, and the question of how restricting the flow of data to be one way compares with two-way flow is studied. It is shown that the one-way version is surprisingly very powerful in that it can solve problems that seemingly require two-way communication. Whether or not one-way communication is strictly weaker than two-way is an open problem, although the conjecture in this paper is in the positive. It is shown, however, that proving this conjecture is at least as hard as some well-known open problems in complexity theory.
Jik H. Chang, Oscar H. Ibarra, Anastasios Vergis
J. ACM3
1986 On the Power of One-Way Communication
abstract
We look at a very simple model of parallel computation and study the question of how restricting the flow of data to be one-way compares with two-way flow. A one-way linear iterative array (1LIA) is a finite one-dimensional array of identical finite-state machines (cells) in which information is allowed to move only in one direction- from left to right. For inputs of length n, the array uses n cells which are initially set to the quiescent state. The serial input, which is applied to the leftmost cell, is accepted if the rightmost cell ever enters an accepting state. We give results which show that 1LIA's are surprisingly very powerful in that they can accept languages which seemingly require two-way communication.
Jik H. Chang, Oscar H. Ibarra, Anastasios Vergis
FOCS3
1986 Testability Conditions for Bilateral Arrays of Combinational Cells
abstract
Two sets of conditions are derived that make one- dimensional bilateral arrays of combinational cells testable for single faulty cells. The test sequences are preset and, in the worst case, grow quadratically with the size of the array. Conditions for testability in linear time are also derived. The basic cell can operate at the bit or at the word level. An implementation of FIR filters using (systolic) one-dimensional bilateral arrays of cells, which can be considered combinational at the word level, is presented as an example. A straightforward generalization for the two- dimensional case is made; a systolic array used for matrix multiplication is presented as an example for this case.
Anastasios Vergis, Kenneth Steiglitz
IEEE Trans. Computers1
1986 C-Testability of Two-Dimensional Iterative Arrays
abstract
The issue of testing two-dimensional iterative arrays with a constant number of test vectors independent of the array size (C-testability) is discussed in this paper. Sufficient conditions for C-testability are stated. It is shown that any two-dimensional array can be modified to become C-testable. An extension to systolic (synchronous) arrays is made. The approach simplifies testing systolic arrays by using one test vector to test many cells of the array in a periodic fashion. A two-dimensional array for matrix multiplication is used to illustrate the approach for systolic arrays.
Hasan Elhuni, Anastasios Vergis, Larry L. Kinney
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2