Demo Data from EDBT 2026 / reviewers in the wild / expert
Anastasios Vergis
dblp:77/3573
· DBLP profile ↗
7ranked-venue papers
4as first author
0since 2021 · last 1996
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 5 · 4 first-authorTheory of computation · 1Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
5 papers |
Electronic design automation · 78% Integrated circuit design · 14% Parallel and multicore computing · 7% | |
| Theoretical computer science
2 papers |
Computational complexity · 76% Automata and formal languages · 24% |
Topics — the 14 heaviest of 15, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.0 | 4 | 1993 | On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992 C-Testability of Two-Dimensional Iterative Arrays · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986 |
Electronic design automation › hardware verification and test › combinational circuit testing
iterative logic array testing |
0.0 | 2 | 1992 | On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992 Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 1993 | On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 |
Electronic design automation › hardware verification and test
fault testing |
0.0 | 1 | 1993 | On the multiple-fault testability of generalized counters · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993 |
Parallel and multicore computing
parallel computation models |
0.0 | 1 | 1988 | On the power of one-way communication · J. ACM 1988 |
Computational complexity
communication complexity |
0.0 | 1 | 1988 | On the power of one-way communication · J. ACM 1988 |
Computational complexity › communication complexity › bounded-round protocols
one-way communication |
0.0 | 1 | 1988 | On the power of one-way communication · J. ACM 1988 |
Electronic design automation › hardware verification and test › testability improvement
c-testability |
0.0 | 1 | 1986 | C-Testability of Two-Dimensional Iterative Arrays · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1986 |
Automata and formal languages
cellular automata |
0.0 | 1 | 1986 | On the Power of One-Way Communication · FOCS 1986 |
Computational complexity › computational models
parallel computation models |
0.0 | 1 | 1986 | On the Power of One-Way Communication · FOCS 1986 |
Electronic design automation › hardware verification and test › test generation
test sequence generation |
0.0 | 1 | 1992 | On the Testability of One-Dimensional ILA's for Multiple Sequential Faults · IEEE Trans. Computers 1992 |
Electronic design automation › high-level synthesis › digital filter design
FIR filter synthesis |
0.0 | 1 | 1986 | Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986 |
Hardware accelerators and domain-specific architectures
systolic array |
0.0 | 1 | 1986 | Testability Conditions for Bilateral Arrays of Combinational Cells · IEEE Trans. Computers 1986 |
Automata and formal languages › language recognition
formal language recognition |
0.0 | 1 | 1986 | On the Power of One-Way Communication · FOCS 1986 |
Methods — techniques the papers use, named apart from their topics
fault modeling · 0.0reduction · 0.0testability analysis · 0.0test vector generation · 0.0test sequence generation · 0.0state machine simulation · 0.0iterative array testing · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1996 | Testing trees for multiple faultsabstractA "well behaving" property is defined for each line (in general a bundle of wires) connecting two combinational logic cells. This property can be easily taken into account in the design process of the circuit. It is shown that all tree-structured circuits of combinational logic cells are easily testable for multiple faults if each line is "well behaving". The size of the test set increases only linearly as the number of cells increases. It is also shown that if no line is well-behaving then only the trivial (exhaustive) test set exists for the circuit, which increases exponentially as the number of cells increases. If there are well-behaving as well as non-well-behaving lines in the circuit, then the size of the test set increases exponentially with the sizes of the non-well-behaving subtrees and linearly with the number of such subtrees. Anastasios Vergis, Carlos Tobon 0002 |
VTS | 1 |
| 1993 | On the multiple-fault testability of generalized countersabstractIt is shown that any generalized counter of full-adder cells is testable for multiple faults with a test set of size proportional to the number of cells. Any number of cells can be faulty in any way, as long as the faults are permanent, the cells remain combinational, and no signal values other than 0 and 1 are generated.> Anastasios Vergis |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 1992 | On the Testability of One-Dimensional ILA's for Multiple Sequential FaultsabstractIt is shown that one-dimensional, unilateral iterative logic arrays (ILAs) of combinational cells are C-testable for multiple sequential faults, provided the fault-free cell functions satisfy appropriate conditions. The test sequence is of length O((m/sup 2/n/sup 2/+mn/sup 3/)*K), where n (resp. m) is the number of signal values that can be applied to the horizontal (resp. vertical) cell input and K> Anastasios Vergis |
IEEE Trans. Computers | 1 |
| 1988 | On the power of one-way communicationabstractIn this paper, a very simple model of parallel computation is considered, and the question of how restricting the flow of data to be one way compares with two-way flow is studied. It is shown that the one-way version is surprisingly very powerful in that it can solve problems that seemingly require two-way communication. Whether or not one-way communication is strictly weaker than two-way is an open problem, although the conjecture in this paper is in the positive. It is shown, however, that proving this conjecture is at least as hard as some well-known open problems in complexity theory. Jik H. Chang, Oscar H. Ibarra, Anastasios Vergis |
J. ACM | 3 |
| 1986 | On the Power of One-Way CommunicationabstractWe look at a very simple model of parallel computation and study the question of how restricting the flow of data to be one-way compares with two-way flow. A one-way linear iterative array (1LIA) is a finite one-dimensional array of identical finite-state machines (cells) in which information is allowed to move only in one direction- from left to right. For inputs of length n, the array uses n cells which are initially set to the quiescent state. The serial input, which is applied to the leftmost cell, is accepted if the rightmost cell ever enters an accepting state. We give results which show that 1LIA's are surprisingly very powerful in that they can accept languages which seemingly require two-way communication. Jik H. Chang, Oscar H. Ibarra, Anastasios Vergis |
FOCS | 3 |
| 1986 | Testability Conditions for Bilateral Arrays of Combinational CellsabstractTwo sets of conditions are derived that make one- dimensional bilateral arrays of combinational cells testable for single faulty cells. The test sequences are preset and, in the worst case, grow quadratically with the size of the array. Conditions for testability in linear time are also derived. The basic cell can operate at the bit or at the word level. An implementation of FIR filters using (systolic) one-dimensional bilateral arrays of cells, which can be considered combinational at the word level, is presented as an example. A straightforward generalization for the two- dimensional case is made; a systolic array used for matrix multiplication is presented as an example for this case. Anastasios Vergis, Kenneth Steiglitz |
IEEE Trans. Computers | 1 |
| 1986 | C-Testability of Two-Dimensional Iterative ArraysabstractThe issue of testing two-dimensional iterative arrays with a constant number of test vectors independent of the array size (C-testability) is discussed in this paper. Sufficient conditions for C-testability are stated. It is shown that any two-dimensional array can be modified to become C-testable. An extension to systolic (synchronous) arrays is made. The approach simplifies testing systolic arrays by using one test vector to test many cells of the array in a periodic fashion. A two-dimensional array for matrix multiplication is used to illustrate the approach for systolic arrays. Hasan Elhuni, Anastasios Vergis, Larry L. Kinney |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |