In a modern system-on-chip design, hundreds of cores and intellectual properties can be integrated into a single chip. To be suitable for high-performance interconnects, designers increasingly adopt advanced interconnect protocols that support novel mechanisms of parallel accessing, including outstanding transactions and out-of-order completion of transactions. To implement those novel mechanisms, a master tags an ID to each transaction to decide in-order or out-of-order properties. However, these advanced protocols may lead to transaction deadlocks that do not occur in traditional protocols. To prevent the deadlock problem, current solutions stall suspicious transactions and in certain cases, many such stalls can incur serious performance penalty. In this brief, we propose a novel ID assignment mechanism that guarantees the issued transactions to be deadlock-free and results in significant reduction in the number of transaction stalls issued by masters. Our experimental results show encouraging performance improvements compared with previous works with little hardware and power overheads.

Coverage metrics are commonly used to measure the completeness of the verification test suites. However, in a modern hardware-accelerated environment, coverage may be analyzed across a simulator and an emulator. Hence, neither conventional coverage techniques performed in simulation nor hardware coverage monitors embedded in an emulator can be directly applied. To resolve the above problem, we propose using coverage assertions to detect coverage events across a simulator and an emulator. In addition, an Assertion Operation Graph and graph-based algorithms are proposed to minimize the hardware and performance overheads of coverage assertions. We perform experiments in the hardware-accelerated environment of Xilinx ISE and show an encouraging reduction of coverage assertion overheads.

Soft error has become an important reliability issue in advanced technologies. To tolerate soft errors, solutions suggested in previous works incur significant performance and power penalties, especially when a design with fault-tolerant structures is overprotected. In this paper, we present a soft-error-tolerant design methodology to tradeoff performance, power, and reliability for different applications. First, four novel detection and correction flip-flop (FF) structures are proposed to provide different levels of tolerance capability against soft errors. Second, architecture-level vulnerability and logic-level susceptibility analyses are employed to identify weak FFs that can easily cause program execution errors. Third, an optimization framework is developed to synthesize the proposed four novel FF structures into weak and highly observable storage bits with the flexibility of trading off performance, power, and reliability. A five-stage pipeline RISC core (UniRISC) is adopted to demonstrate the usefulness of our methodology. Experimental results show that the proposed method can accomplish design goals by balancing performance, power, and reliability. For example, we can not only satisfy the reliability requirement that no more than five errors occur per one billion hours in a design but also reduce up to 87% performance overhead and 91% power overhead when compared with previous works.

Clock skew minimization is an important design consideration. However, with the advance of the technology and the smaller device scaling, Process, Voltage, and Temperature (PVT) variations make the clock skew minimization face great challenges. To mitigate the impact of PVT variations, many previous works proposed the Post Silicon Tuning (PST) architecture to dynamically balance the skew of a clock tree. In the PST architecture, there are two main components: Adjustable Delay Buffer (ADB) and Phase Detector (PD). In this paper, we make a survey about existing techniques to the PST architecture and introduce several important design concerns such as the ADB selection, system controlling, and design testing to the PST architecture.

Mutation Analysis (MA) is a fault-based simulation technique that is used to measure the quality of testbenches in error (mutant) detection. Although MA effectively reports the living mutants to designers, it suffers from the high simulation cost. This paper presents a probabilistic MA preprocessing technique, Error Propagation Analysis (EPA), to speed up the MA process. EPA can statically estimate the probability of the error propagation with respect to each mutant for guiding the observation-point insertion. The inserted observation-points will reveal a mutant's status earlier during the simulation such that some useless testcases can be discarded later. We use the mutant model from an industrial EDA tool, Certitude, to conduct our experiments on the OpenCores' RT-level designs. The experimental results show that the EPA approach can save about 14% CPU time while obtaining the same mutant status report as the traditional MA approach.

Instead of minimizing clock skew, skew can be useful to improve circuit performance. However, it is difficult to apply useful skew to a design with complicated power modes. With only one clock tree, useful skew in one power mode may be harmful in another power mode. In this paper, we propose to use adjustable delay buffers (ADBs) to construct a tunable clock tree so that useful skew can be assigned for different power modes. Assuming positions of ADBs are determined, we assign delays of ADBs for each power mode by LP. Then a speedup theorem is proposed to greatly reduce LP inequalities. We also propose an efficient method to select positions of ADBs. Our experimental results show that average 99.45% inequities are decreased and an average performance improvement of 27.35% is obtained compared with commercial tool SOC Encounter™.

Clock skew optimization continues to be an important concern in circuit designs. To overcome the influence caused by PVT variations, the automatic skew synchronization scheme can dynamically adjust and reduce the clock skew after a chip is manufactured. There are two key components in the skew synchronization scheme: Adjustable Delay Buffer (ADB) and Phase Detector (PD). Most previous researchers have emphasized on ADB placement issues. In this paper, we show that the connection between FFs and PDs can also greatly influence the final clock skew due to the insertion of the PDs. We first analyze the influence of PD connection structures. Then we propose an algorithm to generate a PD connection structure which achieves the minimum influence to the clock skew. Our experimental results are very encouraging.

Clock skew minimization has been an important design constraint. However, due to the complexity of Process, Voltage, and Temperature (PVT) variations, the minimization of clock skew has faced a great challenge. To overcome the influence of PVT variations, several previous works proposed Post Silicon Tuning (PST) architecture to dynamically balance the skew of a clock tree. In the PST architecture, there are two main components: Adjustable Delay Buffer (ADB) and Phase Detector (PD). Most previous works focus on determining good positions of ADBs in a PST design. In this paper, we first show that which pairs of FFs are connected to PDs, called PD structure, also greatly influence the complexity of hardware control for a PST design. Without careful planning of a PD structure, we need large number of control signals to adjust the delays of ADBs. In addition, we also show that a PD structure may influence the accuracy of the clock skew. Among possible connection structures, this paper proposes an efficient PD structure which not only simplifies the hardware control but also minimizes the clock skew of a PST design.