EDBT 2026 Demo / reviewers in the wild / expert
John Andrews
dblp:78/1353
· DBLP profile ↗
7ranked-venue papers
4as first author
2since 2021 · last 2025
0009-0002-8898-7681ORCID · reported
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 3 first-authorHuman-computer interaction and ubiquitous computing · 1 · 1 since 2021Theory of computation · 1 · 1 first-author · 1 since 2021Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Human-computer interaction and pervasive computing
1 paper |
Interaction techniques and input · 50% Immersive interaction · 50% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Immersive interaction › extended reality
extended reality interaction |
0.9 | 1 | 2025 | ForcePinch: Force-Responsive Spatial Interaction for Tracking Speed Control in XR · UIST 2025 |
Interaction techniques and input
spatial interaction |
0.9 | 1 | 2025 | ForcePinch: Force-Responsive Spatial Interaction for Tracking Speed Control in XR · UIST 2025 |
Methods — techniques the papers use, named apart from their topics
pinch force sensing · 0.9
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2025 | ForcePinch: Force-Responsive Spatial Interaction for Tracking Speed Control in XRabstracta) Fast Tracking Speed (b) Slow Tracking Speed Figure 1: ForcePinch is an object manipulation method that allows users to control the tracking speed of a mid-air pointer by modulating pinch force during object manipulation.(a) A light pinch results in fast tracking, supporting broad and rapid movements.(b) A heavy pinch produces slow tracking, allowing for fine-grained precision. Chenyang Zhang 0002, Tiffany S. Ma, John Andrews, Eric J. Gonzalez, Mar González-Franco, Yalong Yang 0001 |
UIST | 3 |
| 2023 | Etherless Ethereum tokens: Simulating native tokens in EthereumabstractStandardized Ethereum tokens, e.g., ERC-20 tokens, have become the norm in fundraising (through ICOs) and kicking off blockchain-based DeFi applications. However, they require the user's wallet to hold both tokens and ether to pay the gas fee for making a transaction. This makes for a cumbersome user experience, and complicates, from the user perspective, the process of transitioning to a different smart-contract enabled blockchain, or to a newly launched blockchain. We formalize, instantiate, and analyze in a composable manner a system that we call Etherless Ethereum Tokens (in short, EETs), which allows the token users to transact in a closed-economy manner, i.e., having only tokens on their wallet and paying any transaction fees in tokens rather than Ether/Gas. In the process, we devise a methodology for capturing Ethereum token-contracts in the Universal Composability (UC) framework, which can be of independent interest. John Andrews, Michele Ciampi, Vassilis Zikas |
J. Comput. Syst. Sci. | 1 |
| 2004 | Steller Watch time-lapse photography system for remote Steller Sea Lion sitesabstractThe ultimate goal of the Steller Watch system is a tool that would provide comprehensive imagery data from remote locations for analyzing Steller Sea Lion behavior and a rich data set for scientific analyses. This project directly addresses three of the thirteen funding priorities for Steller Sea Lions: (1) predation by other mammals; (2) juvenile and pup survival rates; and (3) population counts. Alex B. Kulinchenko, Eric O. Rogers, Yuliya Kopylova, Eddie Olsen, John Andrews, Patrick K. Simpson, Marc Jones |
IGARSS | 5 |
| 1994 | Roadmap for Extending IEEE 1149.1 for Hierarchical Control of Locally-Stored, Standardized-Command-Set Test ProgramsabstractThis paper proposes a roadmap for an embedded system test strategy that uses IEEE Standard 1149.1 as a multidrop, addressable backplane test bus to provide test access by a central diagnostic processor to local diagnostics contained in flash memory chips located on each module. This proposal is an 1149.1 extension based upon the SCAN Bridge which in turn was based on Bhavsar's paper (1991) which extended 1149.1 as a backplane test bus. This roadmap also borrows some of the key features of IEEE P1149.5, a proposed standard backplane test bus. John Andrews |
ITC | 1 |
| 1994 | Using SCANTM Bridge as an IEEE 1149.1 Protocol Addressable, Multi-Drop, Backplane Test BusabstractNational Semiconductor's SCAN Bridge is being used to provide an addressable, multi-drop, 1149.1-based backplane test bus. Its architecture is based upon defining two additional protocols to extend IEEE 1149.1 for use as a backplane test bus: an address protocol and a park protocol. These allow features such as the single, multicast, and broadcast address modes of P1149.5 to be included in the bridge. John Andrews |
ITC | 1 |
| 1992 | IEEE 1149.1 Applied to Mixed TTL-ECL and Differential LogicabstractAlthough IEEE 1149.1-1990 has been primarily applied as a boundary-scan (B/S) standard to transistor-transistor logic (TTL) compatible systems, the standard is logicfamily independent. This paper makes recommendations for the application of 1149.1 to both mixed family TTL-ECL modules and to differential logic signals. It compares the use of one or two output cells and one, two or three input cells and makes recommendations for the optimum application of 1149.1 to differential logic signals. John Andrews |
ITC | 1 |
| 1991 | Stuck Fault and Current Testing Comparison Using CMOS Chip TestabstractThis paper compares the effectiveness of Stuck Fault and Current Testing, as applied to CMOS ICs. The comparison is performed by testing sequential CMOS chips using patterns developed via both methodis, and evaluating their ability to identify faulty prciduct. The test results are then contrasted to a previous study in which a smaller, combinatorial chip was tested by the same means. The results indicate that, for the investigated set of chips, Current Testing provides a better screen of defective product for some classes of defects, while Stuck Fault Testing is more effective on others. Thomas M. Storey, Wojciech Maly, John Andrews, Myron Miske |
ITC | 3 |