Kolar L. Kodandapani

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8ranked-venue papers
6as first author
0since 2021 · last 1980
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 8 · 6 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
4 papers
Electronic design automation · 75% Interconnection networks and networks-on-chip · 22% Processor architecture and microarchitecture · 3%

Topics — the 10 heaviest of 11, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.031980
Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets · IEEE Trans. Computers 1980
Diagnosis of Faults in Linear Tree Networks · IEEE Trans. Computers 1977
A Note on Easily Testable Realizations for Logic Functions · IEEE Trans. Computers 1974
Electronic design automation › hardware verification and test
fault detection
0.021977
Diagnosis of Faults in Linear Tree Networks · IEEE Trans. Computers 1977
A Note on Easily Testable Realizations for Logic Functions · IEEE Trans. Computers 1974
Electronic design automation › hardware verification and test › fault detection
bridging fault detection
0.011980
Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets · IEEE Trans. Computers 1980
Interconnection networks and networks-on-chip › switching network
multistage interconnection network
0.011980
A Uniform Representation of Single- and Multistage Interconnection Networks Used in SIMD Machines · IEEE Trans. Computers 1980
Electronic design automation › hardware verification and test
fault diagnosis
0.011977
Diagnosis of Faults in Linear Tree Networks · IEEE Trans. Computers 1977
Electronic design automation › hardware verification and test › fault detection
multiple fault detection
0.011977
Diagnosis of Faults in Linear Tree Networks · IEEE Trans. Computers 1977
Electronic design automation
logic synthesis
0.011974
A Note on Easily Testable Realizations for Logic Functions · IEEE Trans. Computers 1974
Electronic design automation › logic synthesis
reed-muller expansion
0.011974
A Note on Easily Testable Realizations for Logic Functions · IEEE Trans. Computers 1974
Electronic design automation › hardware verification and test › fault testing
stuck-at fault testing
0.011974
A Note on Easily Testable Realizations for Logic Functions · IEEE Trans. Computers 1974
Processor architecture and microarchitecture › SIMD
SIMD machine
0.011980
A Uniform Representation of Single- and Multistage Interconnection Networks Used in SIMD Machines · IEEE Trans. Computers 1980

Methods — techniques the papers use, named apart from their topics

switching theory · 0.0equivalence relations · 0.0graph theory · 0.0
YearPublicationVenuePosition
1980 Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets
abstract
The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.
Kolar L. Kodandapani, Dhiraj K. Pradhan
IEEE Trans. Computers1
1980 A Uniform Representation of Single- and Multistage Interconnection Networks Used in SIMD Machines
abstract
A switching theoretic framework for the study of interconnection networks is developed. An equivalence relationship between networks is defined. Single-stage and multistage networks that are particularly useful for single-instruction multiple-data stream (SIMD) machines are studied. It is shown that the networks form two distinct equivalence classes under this definition of equivalence relationship. It is shown that any multistage network can be easily modified to realize the permutations that are admissible by any other network which is equivalent to it.
Dhiraj K. Pradhan, Kolar L. Kodandapani
IEEE Trans. Computers2
1978 A Cellular Array for Multivalued Logic Functions
abstract
An algebraic generalization of the well-known binary q-function array to a multivalued q-function array is presented. It is possible to associate tree-structure realizations for binary q-functions and multivalued q-functions. Synthesis of multivalued functions using this array is very simple.
Kolar L. Kodandapani, Rangaswamy V. Setlur
IEEE Trans. Computers1
1978 On Combinational Networks with Restricted Fan-Out
abstract
Fan-out-free networks of AND, OR, NOT, EXOR, and MAJORITY gates are considered. Boolean functions for which such networks exist are defined to be fan-out free. The paper solves the following problems regarding the fan-out-free networks and functions.
Kolar L. Kodandapani, Sharad C. Seth
IEEE Trans. Computers1
1977 A Note on Minimal Reed-Muller Canonical Forms of Switching Functions
abstract
A nonexhaustive procedure for obtaining minimal Reed-Muller canonical (RMC) forms of switching functions is presented. This procedure is a modification of a procedure presented earlier in the literature and enables derivation of an upper bound on the number of RMC forms to be derived to choose a minimal one. It is shown that the task of obtaining minimal RMC forms is simplified in the case of symmetric functions and self-dual functions.
Kolar L. Kodandapani, Rangaswamy V. Setlur
IEEE Trans. Computers1
1977 Diagnosis of Faults in Linear Tree Networks
abstract
The problem of fault detection and location in tree networks of two input EXCLUSIVE-OR (EOR) gates is considered. The fault model assumes that an EOR gate can change to any other function of its two inputs except the equivalence function. An efficient procedure for single fault location is presented. In the worst case the number of tests necessary to locate single faults is bounded by a linear function of the number of input variables. Constructive upper bounds are obtained for the number of tests to detect multiple faults. Optimality of these bounds is argued and extension of results to other types of networks is considered.
Sharad C. Seth, Kolar L. Kodandapani
IEEE Trans. Computers2
1975 Reed-Muller Canonical Forms in Multivalued Logic
abstract
Canonical forms for m-valued functions referred to as m-Reed–Muller canonical (m-RMC) forms that are a generalization of RMC forms of two-valued functions are proposed. m-RMC forms are based on the operations ⊕m (addition mod m) and .m (multiplication mod m) and do not, as in the cases of the generalizations proposed in the literature, require an m-valued function for m not a power of a prime, to be expressed by a canonical form for M-valued functions, where M > m is a power of a prime. Methods of obtaining the m-RMC forms from the truth vector or the sum of products representation of an m-valued function are discussed. Using a generalization of the Boolean difference to m-valued logic, series expansions for m-valued functions are derived.
Kolar L. Kodandapani, Rangaswamy V. Setlur
IEEE Trans. Computers1
1974 A Note on Easily Testable Realizations for Logic Functions
abstract
It is shown that at most, n + 3 tests are required to detect any single stuck-at fault in an AND gate or a single faulty EXCLUSIVE OR (EOR) gate in a Reed-Muller canonical form realization of a switching function.
Kolar L. Kodandapani
IEEE Trans. Computers1