Demo Data from EDBT 2026 / reviewers in the wild / expert
Nizar Jamal
dblp:79/5264
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 50% Hardware reliability and fault tolerance · 38% Parallel and multicore computing · 12% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › system diagnosis › self-diagnosis
distributed self-diagnosis |
0.0 | 1 | 1992 | Efficient Distributed Algorithms for Self Testing of Multiple Processor Systems · IEEE Trans. Computers 1992 |
Electronic design automation › hardware verification and test › VLSI testing
microprocessor testing |
0.0 | 1 | 1992 | Efficient Distributed Algorithms for Self Testing of Multiple Processor Systems · IEEE Trans. Computers 1992 |
Electronic design automation › hardware verification and test
fault diagnosis |
0.0 | 1 | 1992 | Efficient Distributed Algorithms for Self Testing of Multiple Processor Systems · IEEE Trans. Computers 1992 |
Parallel and multicore computing
multiprocessor system |
0.0 | 1 | 1992 | Efficient Distributed Algorithms for Self Testing of Multiple Processor Systems · IEEE Trans. Computers 1992 |
Methods — techniques the papers use, named apart from their topics
simulation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | Efficient Distributed Algorithms for Self Testing of Multiple Processor SystemsabstractMultiple processor systems allow both highly reliable and highly fast service. Distributed self-test algorithms that attempt to improve both the reliability and the performance of these systems are proposed. In these algorithms, reliability is improved by considering the distributed mode of control and assigning processors to test each other periodically for the diagnosis and isolation of the faulty processors and interprocessor links. Meanwhile, performance is improved by considering a dynamic testing strategy and minimizing testing overhead by reducing the number of tests performed on each processor. Simulation results show the effectiveness of the algorithms.> Seyed Hossein Hosseini 0001, Nizar Jamal |
IEEE Trans. Computers | 2 |
| 1991 | Efficient distributed processor level fault diagnosis of multiple processor systemsabstractA distributed processor level fault diagnosis algorithm is proposed where every processor will come up with its own conclusion about the status of other processors and also the links connecting it to its neighboring processors. Performance is improved by considering a dynamic testing strategy where each processor is assigned a small number of processors to test it, ideally two. Then, when some processors or links fail, a new testing assignment is made among the processors. Simulation results are presented to show that the proposed algorithm is effective in reducing the testing overhead.> Seyed Hossein Hosseini 0001, Nizar Jamal |
ICDCS | 2 |