Demo Data from EDBT 2026 / reviewers in the wild / expert
Werner Fleischhammer
dblp:80/5565
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1979
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 75% Distributed systems · 25% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
digital circuit design |
0.0 | 1 | 1979 | The Anomalous Behavior of Flip-Flops in Synchronizer Circuits · IEEE Trans. Computers 1979 |
Distributed systems
fault tolerance |
0.0 | 1 | 1979 | The Anomalous Behavior of Flip-Flops in Synchronizer Circuits · IEEE Trans. Computers 1979 |
Integrated circuit design › digital circuit design › sequential circuit design
flip-flop |
0.0 | 1 | 1979 | The Anomalous Behavior of Flip-Flops in Synchronizer Circuits · IEEE Trans. Computers 1979 |
Integrated circuit design
synchronizer circuits |
0.0 | 1 | 1979 | The Anomalous Behavior of Flip-Flops in Synchronizer Circuits · IEEE Trans. Computers 1979 |
Methods — techniques the papers use, named apart from their topics
failure rate analysis · 0.0circuit measurement · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1979 | The Anomalous Behavior of Flip-Flops in Synchronizer CircuitsabstractQuantitative results of the observations of oscillatory and metastable behavior of common flip-flops in response to logically undefined input conditions, such as those that occur in synchronizers and arbiters, are presented. The results are obtained with the help of a circuit developed for this purpose which measures the failure rate for a certain flip-flop and frequency. It is found that the obtained results are in good correlation with observed failure rates of a synchronizer with both short and long flip-flop resolution times allowed. Werner Fleischhammer, Osman Dörtok |
IEEE Trans. Computers | 1 |