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Pat Lamey

dblp:80/6203 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1986
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 67% Hardware reliability and fault tolerance · 33%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.011986
Early verification of prototype tooling for IC designs · DAC 1986
Hardware reliability and fault tolerance
manufacturing defects		 0.011986
Early verification of prototype tooling for IC designs · DAC 1986
Electronic design automation
semiconductor manufacturing		 0.011986
Early verification of prototype tooling for IC designs · DAC 1986
YearPublicationVenuePosition
1986 Early verification of prototype tooling for IC designs
abstract
This paper presents an overview of IC manufacturing of design prototypes. The impact of manufacturing errors on the product development process is discussed. Alternative ways of reducing the impact of these errors are considered.
Pat Lamey
 DAC1