Demo Data from EDBT 2026 / reviewers in the wild / expert
Andreas Farid Pour
dblp:83/39
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1993
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Memory systems · 70% Hardware reliability and fault tolerance · 30% |
Topics — the 3 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems
cache |
0.0 | 1 | 1993 | Performance Implications of Tolerating Cache Faults · IEEE Trans. Computers 1993 |
Memory systems › cache › cache technology
fault-tolerant cache |
0.0 | 1 | 1993 | Performance Implications of Tolerating Cache Faults · IEEE Trans. Computers 1993 |
Memory systems › cache
cache performance |
0.0 | 1 | 1993 | Performance Implications of Tolerating Cache Faults · IEEE Trans. Computers 1993 |
Methods — techniques the papers use, named apart from their topics
trace-driven simulation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1993 | Performance Implications of Tolerating Cache FaultsabstractThe authors investigate how much cache miss ratios increase when blocks are disabled. It is shown how the mean miss ratio increase can be characterized as a function of the miss ratios of related caches, an efficient approach is developed for calculating the exact distribution of miss ratio increases from all fault patterns, and this approach is applied to the ATUM traces (see A. Agarwal et al., 1986). Results reveal that the mean relative miss ratio increase from a few faults decreases with increasing cache size and is negligible (> Andreas Farid Pour, Mark D. Hill |
IEEE Trans. Computers | 1 |