Demo Data from EDBT 2026 / reviewers in the wild / expert
Hao N. Nham
dblp:84/4532
· DBLP profile ↗
6ranked-venue papers
1as first author
0since 2021 · last 1987
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 6 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
6 papers |
Electronic design automation · 93% Performance modeling and evaluation · 3% Integrated circuit design · 3% |
Topics — the 13 heaviest of 13, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
circuit simulation |
0.0 | 3 | 1984 | The second generation motis mixed-mode simulator · DAC 1984 A multiple delay simulator for MOS LSI circuits · DAC 1980 A mixed-mode simulator · DAC 1980 |
Electronic design automation › hardware simulation › multilevel simulation
mixed-mode simulation |
0.0 | 2 | 1984 | The second generation motis mixed-mode simulator · DAC 1984 A mixed-mode simulator · DAC 1980 |
Electronic design automation › hardware verification and test
fault collapsing |
0.0 | 1 | 1987 | Algorithms for an Advanced Fault Simulation System in MOTIS · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation › hardware verification and test
fault modeling |
0.0 | 1 | 1987 | Algorithms for an Advanced Fault Simulation System in MOTIS · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation › hardware verification and test
fault simulation |
0.0 | 1 | 1987 | Algorithms for an Advanced Fault Simulation System in MOTIS · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation › hardware verification and test
hardware verification |
0.0 | 1 | 1987 | Algorithms for an Advanced Fault Simulation System in MOTIS · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation
physical design |
0.0 | 1 | 1983 | A data structure for MOS circuits · DAC 1983 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1982 | A fault simulator for MOS LSI circuits · DAC 1982 |
Electronic design automation › hardware verification and test
logic simulation |
0.0 | 1 | 1980 | A multiple delay simulator for MOS LSI circuits · DAC 1980 |
Electronic design automation › hardware verification and test › logic simulation
multiple delay simulation |
0.0 | 1 | 1980 | A multiple delay simulator for MOS LSI circuits · DAC 1980 |
Performance modeling and evaluation
simulation |
0.0 | 1 | 1987 | Algorithms for an Advanced Fault Simulation System in MOTIS · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Integrated circuit design › digital circuit design
MOS circuits |
0.0 | 1 | 1983 | A data structure for MOS circuits · DAC 1983 |
Integrated circuit design › VLSI design
MOS VLSI circuits |
0.0 | 1 | 1980 | A mixed-mode simulator · DAC 1980 |
Methods — techniques the papers use, named apart from their topics
fault list manipulation · 0.0transistor-level logical evaluation · 0.0timing simulation · 0.0logic simulation · 0.0fault simulation · 0.0delay computation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1987 | Algorithms for an Advanced Fault Simulation System in MOTISabstractIn this paper, we will present algorithms developed for an advanced fault simulation system in the MOTIS simulation environment. In particular, the algorithm to perform fault modeling and collapsing is first reviewed. Efficient algorithms to perform fault simulation are discussed in terms of fault list manipulation and primitive evaluation. The simulator realizes a speed gain factor of 787 to 2088 over serial fault simulation. Special emphasis is on an innovative fast unit delay fault simulation algorithm that achieves an additional 33-39-percent improvement in speed and 20-28-percent improvement in memory usage. Chi-Yuan Lo, Hao N. Nham, Ajoy K. Bose |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 1984 | The second generation motis mixed-mode simulator
Chin-Fu Chen, Chi-Yuan Lo, Hao N. Nham, Prasad Subramaniam |
DAC | 3 |
| 1983 | A data structure for MOS circuits
Chi-Yuan Lo, Hao N. Nham, Ajoy K. Bose |
DAC | 2 |
| 1982 | A fault simulator for MOS LSI circuitsabstractThis paper describes a fault simulator for MOS LSI circuits. The basic primitives for this simulator are MOS transistor structures where the transistors are evaluated logically. The simulator provides the capability of modeling and simulating both the classical input/output stuck-at faults and the non-classical transistor stuck-on and stuck-open faults. Ajoy K. Bose, Patrick Kozak, Chi-Yuan Lo, Hao N. Nham, Ernesto Pacas-Skewes, Kwok W. Wu |
DAC | 4 |
| 1980 | A mixed-mode simulatorabstractTo provide flexibility and efficiency in logic and timing verification of MOS VLSI circuits, it is desirable that various portions of a circuit can be described and simulated at appropriate levels of detail. Such a capability is provided by the Mixed-Mode Simulator described here. This simulator allows different elements of a circuit to be modeled and simulated at different levels of detail. The modeling levels are MOS transistor level, logic gate level and functional level. The simulation levels are timing, multiple delay and unit delay. The simulator is being used on production LSI chips and its performance is discussed. Vishwani D. Agrawal, Ajoy K. Bose, Patrick Kozak, Hao N. Nham, Ernesto Pacas-Skewes |
DAC | 4 |
| 1980 | A multiple delay simulator for MOS LSI circuitsabstractThis paper describes a multiple delay simulator for MOS LSI circuits. The basic primitives for this simulator are MOS transistor structures where the transistors are evaluated logically. Integer rise and fall delays are associated with each transition and these delays are computed automatically based on device characteristics and circuit capacitances. The simulator has been extensively used for the design verification of production LSI chips. Hao N. Nham, Ajoy K. Bose |
DAC | 1 |