Demo Data from EDBT 2026 / reviewers in the wild / expert
Alexander Finder
dblp:84/8186
· DBLP profile ↗
8ranked-venue papers
4as first author
0since 2021 · last 2014
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 6 · 3 first-authorSoftware engineering, systems software and programming languages · 2 · 1 first-authorArtificial intelligence and machine learning · 1Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Electronic design automation · 84% Performance modeling and evaluation · 16% |
Topics — the 6 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.3 | 2 | 2014 | Latency Analysis for Sequential Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 Automated feature localization for hardware designs using coverage metrics · DAC 2012 |
Performance modeling and evaluation
delay analysis |
0.2 | 1 | 2014 | Latency Analysis for Sequential Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 |
Electronic design automation › hardware verification and test
hardware verification |
0.2 | 1 | 2014 | A Simulation-Based Approach for Automated Feature Localization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 |
Electronic design automation › hardware verification and test › formal verification
sequential circuit verification |
0.2 | 1 | 2014 | Latency Analysis for Sequential Circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 |
Electronic design automation › hardware verification and test › coverage analysis
coverage metrics |
0.1 | 1 | 2012 | Automated feature localization for hardware designs using coverage metrics · DAC 2012 |
Electronic design automation › hardware verification and test
coverage-driven verification |
0.0 | 1 | 2012 | Automated feature localization for hardware designs using coverage metrics · DAC 2012 |
Methods — techniques the papers use, named apart from their topics
simulation-based analysis · 0.2heuristic algorithm · 0.2exact algorithm · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2014 | Latency Analysis for Sequential CircuitsabstractVerifying correctness is a major bottleneck in today's circuit and system design. Verification includes the tasks of error detection, error localization, and error correction in an implemented design, as well as the analysis and avoidance of transient faults. For all those tasks, knowing when an assignment to signals becomes observable at the outputs and for how long it influences the system is important. In this letter, we propose a minimal and maximal latency measure for sequential circuits. This measure explains how long a circuit's state and outputs depend on input stimuli. Exact and heuristic algorithms are discussed to determine the measure. We evaluate the algorithms on state-of-the-art designs. Experimental results show how the measure provides insight into the behavior of circuit designs. Alexander Finder, André Sülflow, Görschwin Fey |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2014 | A Simulation-Based Approach for Automated Feature LocalizationabstractThe complexity of modern chips is rapidly increasing. To fulfill tight time-to-market constraints, more and more blocks from previous designs are reused or third party IP blocks are licensed. However, such blocks are often only poorly documented making adjustments to the blocks a difficult task. This paper presents a technique for automatic feature localization for hardware designs. Our approach helps a developer in understanding a design by localizing parts of the code which implement a certain feature of interest. We evaluate the approach on three open source designs. For those designs, our approach yields a more precise localization of the code implementing the different features than the documentation of the design. Jan Malburg, Alexander Finder, Görschwin Fey |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |
| 2013 | Tuning dynamic data flow analysis to support design understandingabstractModern chip designs are getting more and more complex. To fulfill tight time-to-market constraints, third-party blocks and parts from previous designs are reused. However, these are often poorly documented, making it hard for a designer to understand the code. Therefore, automatic approaches are required which extract information about the design and support developers in understanding the design. In this paper we introduce a new dynamic data flow analysis tuned to automate design understanding. We present the use of the approach for feature localization and for understanding the design's data flow. In the evaluation, our analysis improves feature localization by reducing the uncertainty by 41% to 98% compared to a previous approach using coverage metrics. Jan Malburg, Alexander Finder, Görschwin Fey |
DATE | 2 |
| 2013 | Debugging HDL designs based on functional equivalences with high-level specificationsabstractThe increasing complexity of circuits and systems is forcing design specifications to software-like programming languages like C. Since the conversion from software to hardware is a difficult task solved manually, bugs are frequently introduced in the HDL design. Sophisticated automated error localization and correction techniques, i.e. debugging, are a challenge. In this paper a new automated method is presented for debugging hardware implementations when a software-like specification in C is given. Based on functional equivalences between software and hardware, error localization and correction are automated. We present experimental results for different types of designs and different types of faults. Alexander Finder, Jan-Philipp Witte, Görschwin Fey |
DDECS | 1 |
| 2012 | Automated feature localization for hardware designs using coverage metricsabstractDue to the increasing complexity modern System on Chip designs are developed by large design teams. In addition, existing design blocks are re-used such that the knowledge about these parts of the design entirely depends on the quality of the documentation. For a single designer it is almost impossible to have detailed knowledge about all blocks and their interaction. Jan Malburg, Alexander Finder, Görschwin Fey |
DAC | 2 |
| 2011 | Latency Analysis for Sequential CircuitsabstractVerification is a major bottleneck in today's circuit and system design. This includes the tasks of error detection, error localization, and error correction in an implemented design as well as the analysis and avoidance of transient faults. For all those tasks, knowing for how long values of signals influence the system is important. In this paper, we propose a minimal and maximal latency measure for sequential circuits. This measure explains how long a circuit's state and outputs depend on input stimuli. Exact and heuristic algorithms are proposed to determine the measure. Experiments show that the measure provides insight into the behavior of circuit designs. Alexander Finder, André Sülflow, Görschwin Fey |
ETS | 1 |
| 2011 | Improving ESOP-Based Synthesis of Reversible Logic Using Evolutionary Algorithms
Rolf Drechsler, Alexander Finder, Robert Wille |
EvoApplications (2) | 2 |
| 2010 | Evaluating Debugging Algorithms from a Qualitative Perspective
Alexander Finder, Görschwin Fey |
FDL | 1 |