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Smitha Shyam

dblp:85/4566 · DBLP profile ↗
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3ranked-venue papers
2as first author
0since 2021 · last 2007
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 2 first-authorSoftware engineering, systems software and programming languages · 3 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Processor architecture and microarchitecture · 41% Hardware reliability and fault tolerance · 31% Electronic design automation · 19%

Topics — the 6 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Processor architecture and microarchitecture › pipelining
pipelined processor
0.112006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006
Hardware reliability and fault tolerance
soft errors
0.112006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006
Electronic design automation › hardware verification and test › design for testability
built-in self-test
0.012006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006
Processor architecture and microarchitecture
checkpoint-based microarchitecture
0.012006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006
Distributed systems › fault tolerance
checkpointing
0.012006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006
Electronic design automation › hardware verification and test
online testing
0.012006
Ultra low-cost defect protection for microprocessor pipelines · ASPLOS 2006

Methods — techniques the papers use, named apart from their topics

circuit-level simulation · 0.1architectural simulation · 0.1
YearPublicationVenuePosition
2007 Low-cost protection for SER upsets and silicon defects
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kypros Constantinides, Valeria Bertacco, Todd M. Austin
DATE3
2006 Ultra low-cost defect protection for microprocessor pipelines
abstract
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Silicon failure mechanisms, such as transistor wearout and manufacturing defects, are a growing challenge that threatens the yield and product lifetime of future systems. In this paper we introduce the BulletProof pipeline, the first ultra low-cost mechanism to protect a microprocessor pipeline and on-chip memory system from silicon defects. To achieve this goal we combine area-frugal on-line testing techniques and system-level checkpointing to provide the same guarantees of reliability found in traditional solutions, but at much lower cost. Our approach utilizes a microarchitectural checkpointing mechanism which creates coarse-grained epochs of execution, during which distributed on-line built in self-test (BIST) mechanisms validate the integrity of the underlying hardware. In case a failure is detected, we rely on the natural redundancy of instructionlevel parallel processors to repair the system so that it can still operate in a degraded performance mode. Using detailed circuit-level and architectural simulation, we find that our approach provides very high coverage of silicon defects (89%) with little area cost (5.8%). In addition, when a defect occurs, the subsequent degraded mode of operation was found to have only moderate performance impacts, (from 4% to 18% slowdown).
Smitha Shyam, Kypros Constantinides, Sujay Phadke, Valeria Bertacco, Todd M. Austin
ASPLOS1
2006 Distance-guided hybrid verification with GUIDO
abstract
Constrained random simulation is a widespread technique used to perform functional verification on complex digital designs, because it can generate simulation vectors at a very high rate. However, the generation of high-coverage tests remains a major challenge even in light of this high performance. In this paper we present Guido, a hybrid verification software that uses formal verification techniques to guide the simulation towards a verification goal. Guido is novel in that 1) it guides the simulation by means of a distance function derived from the circuit structure, and 2) it has a trace sequence controller that monitors and controls the direction of the simulation by striking a balance between random chance and controlled hill-climbing. We present experimental results indicating that Guido can tackle complex designs, including a picoJava microprocessor, and reach a verification goal in far fewer simulation cycles than random
Smitha Shyam, Valeria Bertacco
DATE1