The authors describe a background study, course developments, and concepts for a curriculum in electronics test engineering. Their conclusion is that appropriate academic programs in electronics test engineering should be developed at the B.S., M.S., and Ph.D levels. The identification of the common background and education, as well as the implementation, of these programs requires strong university/industry cooperation and support. As exemplified by the present study, this process can occur at the local level. However, it is suggested that a broader input and a greater visibility are warranted, and it is recommenced that an organization such as the Test Technology Technical Committee coordinate the development of model curricula for 'meeting the tests of time'.>

Graph theoretic properties of the PLA folding problem which not only give insight into the various folding problems but also provide efficient algorithms for solving the problems are presented. This work is based on the transformation of the PLA into graphs where cliques (completely connected subgraphs) in the graphs correspond to PLA folding sets. A simple heuristic technique known as the greedy algorithm can often identify near-maximum cliques in polynomial time. Experimental data show that this technique is extremely effective when applied to the graphs which generally arise in folding. Variations of the general folding problem such as bipartite folding and constrained folding are addressed.>