Demo Data from EDBT 2026 / reviewers in the wild / expert
Carl D. Roth
dblp:86/5902
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 2000
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › VLSI testing
defect-based testing |
0.0 | 1 | 2000 | A novel algorithm to extract two-node bridges · DAC 2000 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 2000 | A novel algorithm to extract two-node bridges · DAC 2000 |
Electronic design automation › physical design
layout analysis |
0.0 | 1 | 2000 | A novel algorithm to extract two-node bridges · DAC 2000 |
Electronic design automation
physical design |
0.0 | 1 | 2000 | A novel algorithm to extract two-node bridges · DAC 2000 |
Methods — techniques the papers use, named apart from their topics
bridge extraction algorithm · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2000 | A novel algorithm to extract two-node bridgesabstractDefect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity. Sujit T. Zachariah, Sreejit Chakravarty, Carl D. Roth |
DAC | 3 |