Demo Data from EDBT 2026 / reviewers in the wild / expert
Madhu A. Metha
dblp:87/5644
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1977
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 91% Integrated circuit design · 9% |
Topics — the 3 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
fault diagnosis |
0.0 | 1 | 1977 | Synthesis of Optimal Amiguity Resolver Functions · IEEE Trans. Computers 1977 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1977 | Synthesis of Optimal Amiguity Resolver Functions · IEEE Trans. Computers 1977 |
Electronic design automation › hardware verification and test › design for testability
test point selection |
0.0 | 1 | 1977 | Synthesis of Optimal Amiguity Resolver Functions · IEEE Trans. Computers 1977 |
Methods — techniques the papers use, named apart from their topics
optimal ambiguity resolver synthesis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1977 | Synthesis of Optimal Amiguity Resolver FunctionsabstractLarge-scale integration (LSI) circuits impose particular constraints and present special opportunities for improving the diagnostic resolution of a digital system. In particular, bond failures represent a very significant failure mode in integrated circuits, so it is important to be able to identify a fault on an input/output lead to a single bus of a least replaceable unit, and it is desirable to do this using a minimum number of test points. Madhu A. Metha, William Bridges Smith |
IEEE Trans. Computers | 1 |