Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page
Demo Data from EDBT 2026 / reviewers in the wild / expert

P. Mann

dblp:88/1327 · DBLP profile ↗
← Back
1ranked-venue papers
0as first author
0since 2021 · last 1988
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 87% Hardware reliability and fault tolerance · 13%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
design for testability		 0.011988
A Defect-Tolerant and Fully Testable PLA · DAC 1988
Electronic design automation
hardware verification and test		 0.011988
A Defect-Tolerant and Fully Testable PLA · DAC 1988
Hardware reliability and fault tolerance
defect tolerance		 0.011988
A Defect-Tolerant and Fully Testable PLA · DAC 1988
YearPublicationVenuePosition
1988 A Defect-Tolerant and Fully Testable PLA
Norbert Wehn, Manfred Glesner, K. Caesar, P. Mann, A. Roth
 DAC4