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Bernhard Eschermann

dblp:90/679 · DBLP profile ↗
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8ranked-venue papers
6as first author
0since 2021 · last 1993
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 8 · 6 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
design for testability
0.021992
Optimized synthesis techniques for testable sequential circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992
A Unified Approach for the Synthesis of Self-Testable Finite State Machines · DAC 1991
Electronic design automation
hardware verification and test
0.021992
Optimized synthesis techniques for testable sequential circuits · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992
A Unified Approach for the Synthesis of Self-Testable Finite State Machines · DAC 1991
Electronic design automation › logic synthesis
finite state machine synthesis
0.011991
A Unified Approach for the Synthesis of Self-Testable Finite State Machines · DAC 1991
Electronic design automation
logic synthesis
0.011991
A Unified Approach for the Synthesis of Self-Testable Finite State Machines · DAC 1991

Methods — techniques the papers use, named apart from their topics

state encoding · 0.0quadratic assignment problem formulation · 0.0finite state machine synthesis · 0.0signature register · 0.0pattern generation · 0.0built-in self-test · 0.0
YearPublicationVenuePosition
1993 Enhancing on-line testability during synthesis
Bernhard Eschermann
J. Electron. Test.1
1992 An implicitly testable boundary scan TAP controller
Bernhard Eschermann
J. Electron. Test.1
1992 Synthesis and self-test of random logic control units
Bernhard Eschermann
Integr.1
1992 Optimized synthesis techniques for testable sequential circuits
abstract
The authors describe a synthesis approach that maps a behavioral finite state machine (FSM) description into a testable gate-level structure. The term testable, besides implying the existence of tests, also means that the application of test patterns is facilitated. Depending on the test strategy, the state registers of the FSM are modified, e.g. as scan path or self-test registers. The additional functionality of these state registers is utilized in system mode by interpreting them as smart state registers, capable of producing certain state transitions on their own. To make the best use of such registers, the authors propose a novel state encoding strategy based on an analytic formulation of the coding constraint satisfaction problem as a quadratic assignment problem. An additional minimization potential can be exploited by appropriately choosing the pattern generator for self-testable designs. Experimental results indicate that, compared with conventional design for testability approaches, significant savings are possible this way.>
Bernhard Eschermann, Hans-Joachim Wunderlich
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1991 A Unified Approach for the Synthesis of Self-Testable Finite State Machines
abstract
Conventionallyself-test hardware is added after synthesis is completed.For highly sequential circuits like controllers this design method either leads to high hardware overheads or compromises fault coverage.In this paper we outline a unified approach for considering self-test hardware like pattern generators and signature registers during synthesis.Three novel target structures are present@ and a method for designing parallel self-testable circuits is discussed in more detail.For a collection of benchmark circuits we show that hardware overheads for self-testable circuits can be significantly reduced this way without sacriilcing testability.
Bernhard Eschermann, Hans-Joachim Wunderlich
DAC1
1991 Module Generation for AND/XOR Fields (XPLAs)
abstract
Combinational functions involving XOR-operations, e.g. Reed-Muller forms (RMFs) or parity functions, often yield area-inefficient realizations when standard synthesis algorithms are used. A specialized module generator targeted towards such functions was implemented. XPLAs, the resulting novel PLA-like structures for mixed polarity RMFs, are compared with conventional PLAs in order to assess whether the theoretical advantages of RMFs over sum-of-products representations can be transformed into practical benefits. It is shown that although testability is a definite plus of these structures, area considerations will probably restrict the use of RMF minimizers to special applications.>
Jürgen Frößl, Bernhard Eschermann
ICCD2
1988 Hierarchical placement for macrocells: a 'meet in the middle' approach
abstract
Placement and related aspects of the BEAR macrocell layout system are described. A combination of top-down and bottom-up heuristics is used to make best use of a hierarchical description. The interdependency of placement and routing is considered explicitly. Experimental results show a considerable improvement over previous approaches.>
Bernhard Eschermann, Wayne Wei-Ming Dai, Ernest S. Kuh, Massoud Pedram
ICCAD1
1988 PLA based finite state machines using Johnson counters as state memories
abstract
The authors present a novel state assignment technique for synchronous finite state machines (FSMs) that are implemented as single programmable logic arrays (PLAs) using Johnson counters as state memories. The goal is to minimize the number of product terms in the PLAs and thus the overall area of the FSMs. The authors use a three-step approach to achieve this. First, the FSM description is adapted to allow an optimal use of the computer properties; then the counter is embedded by ordering the internal states of the FSM; and finally the states are coded. The product term reductions obtained are, on the average 20% to 30% compared to conventional D-latch-based FSM implementations.>
Rainer Amann, Bernhard Eschermann, Utz G. Baitinger
ICCD2