Demo Data from EDBT 2026 / reviewers in the wild / expert
Jing-Yi Chen
dblp:91/4359
· DBLP profile ↗
3ranked-venue papers
0as first author
0since 2021 · last 2014
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 100% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › physical design › lithography
lithography hotspot detection |
0.4 | 2 | 2014 | A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 A novel fuzzy matching model for lithography hotspot detection · DAC 2013 |
Electronic design automation
hardware verification and test |
0.2 | 1 | 2014 | A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 |
Electronic design automation
physical design |
0.2 | 1 | 2014 | A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot Detection · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2014 |
Electronic design automation › physical design
lithography |
0.2 | 1 | 2013 | A novel fuzzy matching model for lithography hotspot detection · DAC 2013 |
Electronic design automation › physical design › layout pattern analysis
layout pattern matching |
0.0 | 1 | 2013 | A novel fuzzy matching model for lithography hotspot detection · DAC 2013 |
Electronic design automation
physical verification |
0.0 | 1 | 2013 | A novel fuzzy matching model for lithography hotspot detection · DAC 2013 |
Methods — techniques the papers use, named apart from their topics
grid reduction · 0.2fuzzy matching · 0.2feature vector extraction · 0.2fuzzy matching model · 0.2
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2014 | A Fuzzy-Matching Model With Grid Reduction for Lithography Hotspot DetectionabstractIn advanced IC manufacturing, as the gap increases between lithography optical wavelength and feature size, it becomes challenging to detect problematic layout patterns called lithography hotspot. In this paper, we propose a novel fuzzy matching model which extracts appropriate feature vectors of hotspot and nonhotspot patterns. Our model can dynamically tune appropriate fuzzy regions around known hotspots. Based on this paper, we develop a fast algorithm for lithography hotspot detection with high accuracy of detection and low probability of false-alarm counts. In addition, since higher dimensional size of feature vectors can produce better accuracy but requires longer run time, this paper proposes a grid reduction technique to significantly reduce the CPU run time with very minor impact on the advantages of higher dimensional space. Our results are very encouraging, with average 94.5% accuracy and low false-alarm counts on a set of test benchmarks. Wan-Yu Wen, Jin-Cheng Li, Sheng-Yuan Lin, Jing-Yi Chen, Shih-Chieh Chang 0001 |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 4 |
| 2013 | A novel fuzzy matching model for lithography hotspot detectionabstractIn advanced IC manufacturing, as the gap between lithography optical wavelength and feature size increases, it becomes challenging to detect problematic layout patterns called lithography hotspot. In this paper, we propose a novel fuzzy matching model which can dynamically tune appropriate fuzzy regions around known hotspots. Based on this model, we develop a fast algorithm for lithography hotspot detection with very low chances of false-alarm. Our results are very encouraging with under 0.56 CPU-hrs/mm2 runtime. Sheng-Yuan Lin, Jing-Yi Chen, Jin-Cheng Li, Wan-Yu Wen, Shih-Chieh Chang 0001 |
DAC | 2 |
| 2005 | The Development of Global IPv6 Products: An ExplorationabstractWith the rapid development and enhancement on Internet technology, the shortage of traditional IPv4 address has been gradually recognized. It is estimated that the IPv4 address pool will be run out during 2022-2028. In order not to impede the diffusion and development of Internet technology, the next generation Internet protocol has been proposed. As we know, the invention of the new IP protocol standard provides a solution to solve the problem of insufficient IP address. However, it is a costly and enduring process to migrate from the IPv4 to IPv6. By analyzing worldwide IPv6 related products, we report Taiwan's strength and challenges in developing IPv6 and propose future development for industry and policy making. Shu-Fen Tseng, Hsi-Chieh Lee, Te-Ching Kung, Shou-Lien Chou, Jing-Yi Chen |
AINA | 5 |