EDBT 2026 Demo / reviewers in the wild / expert
Jongwook Jeon
dblp:93/7200
· DBLP profile ↗
2ranked-venue papers
0as first author
2since 2021 · last 2025
0000-0002-5232-650XORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 2 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Memory systems · 56% Integrated circuit design · 44% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Memory systems
emerging memory technologies |
0.9 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Integrated circuit design › emerging device technologies
ferroelectric field-effect transistor |
0.9 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Integrated circuit design
interconnect |
0.9 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Memory systems › processing-in-memory
logic-in-memory |
0.9 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Memory systems
in-memory computing |
0.3 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Memory systems › content-addressable memory
TCAM |
0.3 | 1 | 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2025 |
Methods — techniques the papers use, named apart from their topics
path-finding process-design-kit · 0.9circuit simulation · 0.9
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2025 | Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology NodeabstractThis study delves into the impact of interconnects on Ferroelectric Field-Effect Transistor (FeFET) devices, employing ferroelectric materials in the gate stack for non-volatile memory at the 3nm technology node. Specifically, the study investigates the impact of interconnect on Logic-in-Memory (LiM) circuits. As the impact of interconnect become more pronounced at sub-nanometer scales, they are known to have a significant influence on circuit characteristics beyond the intrinsic properties of the components. Leveraging a newly developed path-finding process-design-kit (PDK), encompassing FeFET characteristics and interconnect properties, we explored various circuit configurations such as full-adder (FA) and ternary content-addressable memory (TCAM). Our investigation revealed that FeFET-based LiM circuits offer advantages in area, propagation delay, and power consumption compared to traditional CMOS-based circuits. While interconnects still influence FeFET-based circuit characteristics, their impact is somewhat tempered in comparison. We meticulously quantified these impacts. The simulation of how the next generation of advanced interconnect processes can further enhance FeFET-based LiM circuit performance was conducted using the PDK. Through this analysis, we proposed guidelines for the layout design of future FeFET-based LiM circuits. Juhwan Park, Huijun Kim, Hanggyo Jung, Changho Ra, Jongwook Jeon |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |
| 2024 | Optimal data distribution in FeFET-based computing-in-memory macrosabstractComputing-in-memory (CIM) may offer a power-efficient solution to the acceleration of major workloads for memory-bound deep neural networks given memory and processing units on the same die, particularly, when incorporating the processing units into the memory domains. Further, CIM macros utilizing nonvolatile memory with multibit data significantly boost their data density and realize zero standby power by gating power when idle. Ferroelectric Field-Effect-Transistor (FeFET) is a leading contender for this type of CIM. In this work, we designed mixed signal CIM macros based on FeFETs and identified their optimal performance with the size of a sub-array (nM× nw) addressed at one cycle, where nwis the number of FeFETs representing a single w-bit weight. The simulations performed identified the optimal sub-array $n_M^{\ast} \times w/2$ for w-bit weights with different $n_M^{\ast}$ (i.e., parallelism) for different weight resolution w, which highlights a ∼29× improvement in figure of merit for 8-bit weights compared with the case of no weight-splitting (nw= 1). Yonguk Sim, Choongseok Song, Jongwook Jeon, Daewoong Kwon, Doo Seok Jeong |
ISCAS | 4 |