Demo Data from EDBT 2026 / reviewers in the wild / expert
Lavi Lev
dblp:96/2762
· DBLP profile ↗
2ranked-venue papers
0as first author
0since 2021 · last 2002
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 77% Integrated circuit design · 23% |
Topics — the 1 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › CAD framework
design tool interoperability |
0.0 | 1 | 2002 | Tools or users: which is the bigger bottleneck? · DAC 2002 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2002 | Tools or users: which is the bigger bottleneck?abstractAs chip design becomes ever more complex, fewer design teams are succeeding. Who's to blame? On one hand, tools are hard to use, buggy, not interoperable, and have missing functionality. On the other hand, there is a wide range of engineering skills within the user population, and tools can be abused within flawed methodologies. This panel will quantify and prioritize the key gaps, including interoperability, that must be addressed on both sides. Andrew B. Kahng, Ronald Collett, Patrick Groeneveld, Lavi Lev, Nancy Nettleton, Paul K. Rodman, Lambert van den Hoven |
DAC | 4 |
| 1995 | Design of an efficient power distribution network for the UltraSPARC-I microprocessorabstractThe design, implementation, and verification of the power distribution network for the 5.2 million transistor UltraSPARC-I microprocessor is described. A novel simulation method allows rapid identification of exact layout locations with potential electromigration or excessive voltage drop problems. Hierarchical verification capabilities of this approach are utilized to design an efficient and robust distribution of V/sub dd/ and V/sub ss/ across a large die, in the face of stringent IR drop and floorplanning constraints. A comprehensive methodology for power distribution and management, along with seamless integration of the power distribution into existing CAD tools throughout the design cycle results in correct-by-construction power networks for cell libraries and functional blocks, area efficient power interconnections and reduced time-to-market due to correction of all reliability failures in the power networks prior to mask generation. Alexander Dalal, Lavi Lev, Sundari Mitra |
ICCD | 2 |